Sakaguchi; Yoshitami

Patent Applications and Registrations

Patent applications and USPTO patent grants for Sakaguchi; Yoshitami.The latest application filed is for "detecting apparatus, system, program, and detecting method".

Company Profile

0.19.19

Sakaguchi; Yoshitami - Hadano JP
Sakaguchi; Yoshitami - Kanagawa-ken JP
Sakaguchi; Yoshitami - Zama JP
Sakaguchi; Yoshitami - Hadano-shi JP
Sakaguchi; Yoshitami - Kanagawa JP
Sakaguchi; Yoshitami - Zama-shi JP
Sakaguchi; Yoshitami - Fujisawa JP
Sakaguchi, Yoshitami - Fujisawa-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Detecting an extraordinary behavior Grant 8,271,981 - Ohba , et al. September 18, 2	2012-09-18
Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel Grant 8,228,269 - Nakano , et al. July 24, 2	2012-07-24
Detecting apparatus, system, program, and detecting method Grant 8,140,915 - Ohba , et al. March 20, 2	2012-03-20
Method, apparatus, and program for detecting the correlation between repeating events Grant 7,974,800 - Ohba , et al. July 5, 2	2011-07-05
Matrix driven liquid crystal display module system, apparatus and method Grant 7,679,614 - Yamada , et al. March 16, 2	2010-03-16
Active matrix panel inspection device and inspection method Grant 7,486,100 - Sakaguchi , et al. February 3, 2	2009-02-03
Detecting Apparatus, System, Program, And Detecting Method App 20080263073 - Ohba; Nobuyuki ; et al.	2008-10-23
Inspection Device For Inspecting Tft App 20080164902 - Sakaguchi; Yoshitami ; et al.	2008-07-10
Method, Apparatus, and Program for Detecting the Correlation Between Repeating Events App 20080137800 - Ohba; Nobuyuki ; et al.	2008-06-12
Method, Apparatus, and Program for Detecting an Extraordinary Behavior App 20080141249 - Ohba; Nobuyuki ; et al.	2008-06-12
Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel Grant 7,317,326 - Nakano , et al. January 8, 2	2008-01-08
Thin film transistor tester and corresponding test method Grant 7,295,030 - Imura , et al. November 13, 2	2007-11-13
Inspection device for inspecting TFT Grant 7,282,943 - Sakaguchi , et al. October 16, 2	2007-10-16
Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel App 20070075727 - Nakano; Daiju ; et al.	2007-04-05
Active matrix panel inspection device, inspection method, and active matrix oled panel manufacturing method App 20070040548 - Sakaguchi; Yoshitami ; et al.	2007-02-22
Matrix driven liquid crystal display module system, apparatus and method App 20060214896 - Yamada; Fumiaki ; et al.	2006-09-28
Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel Grant 7,106,089 - Nakano , et al. September 12, 2	2006-09-12
Thin film transistor array, display panel, method for inspecting the thin film transistor array, and method for manufacturing active matrix organic light emitting diode panel Grant 7,091,667 - Sakaguchi , et al. August 15, 2	2006-08-15
Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel Grant 7,091,738 - Nakano , et al. August 15, 2	2006-08-15
Liquid crystal display driver and method thereof Grant 7,088,324 - Sakaguchi , et al. August 8, 2	2006-08-08
Matrix driven liquid crystal display module system, apparatus and method Grant 7,079,162 - Yamada , et al. July 18, 2	2006-07-18
Liquid crystal display device, liquid crystal controller and video signal transmission method Grant 7,075,505 - Sakaguchi , et al. July 11, 2	2006-07-11
Thin Film Transistor Tester And Corresponding Test Method App 20060097745 - Imura; Kenichi ; et al.	2006-05-11
Liquid crystal display Grant 6,937,233 - Sakuma , et al. August 30, 2	2005-08-30
Inspection device for inspecting TFT App 20050104614 - Sakaguchi, Yoshitami ; et al.	2005-05-19
Inspection system for active matrix panel, inspection method for active matrix panel and manufacturing method for active matrix OLED panel App 20050088198 - Nakano, Dalju ; et al.	2005-04-28
Thin film transistor array, display panel, method for inspecting the thin film transistor array, and method for manufacturing active matrix organic light emitting diode panel App 20050067943 - Sakaguchi, Yoshitami ; et al.	2005-03-31
Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel App 20040246019 - Nakano, Daiju ; et al.	2004-12-09
Reference gamma compensation voltage generation circuit Grant 6,806,861 - Sakaguchi , et al. October 19, 2	2004-10-19
Wiring structure and method thereof for a LCD module Grant 6,661,413 - Sakaguchi December 9, 2	2003-12-09
Matrix driven liquid crystal display module system, apparatus and method App 20030193463 - Yamada, Fumiaki ; et al.	2003-10-16
Liquid crystal display App 20030001808 - Sakuma, Katsuyuki ; et al.	2003-01-02
Low resistance wiring in the periphery region of displays App 20020177281 - Amemiya, Takahisa ; et al.	2002-11-28
Liquid crystal display driver and method thereof App 20020171614 - Sakaguchi, Yoshitami ; et al.	2002-11-21
Matrix Driven Liquid Crystal Display Module System Apparatus And Method App 20020113764 - YAMADA, FUMIAKI ; et al.	2002-08-22
Wiring structure and method thereof for a LCD module App 20010033259 - Sakaguchi, Yoshitami	2001-10-25
Liquid crystal display device, liquid crystal controller and video signal transmission method App 20010013850 - Sakaguchi, Yoshitami ; et al.	2001-08-16
Liquid crystal display panel driving device Grant 6,184,855 - Kobayashi , et al. February 6, 2	2001-02-06

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