| Patent | Date |
|---|
Test Apparatus, Test Method And Recording Medium
App 20220268809 - SAKAGUCHI; Kazuhiro | 2022-08-25 |
Screening method, screening device and program
Grant 8,878,561 - Sakaguchi November 4, 2 | 2014-11-04 |
Screening Device For Semiconductor Devices, Screening Method For Semiconductor Devices And Program Thereof
App 20130103328 - SAKAGUCHI; Kazuhiro | 2013-04-25 |
Screening Method, Screening Device And Program
App 20130057311 - SAKAGUCHI; Kazuhiro | 2013-03-07 |
Method and apparatus for processing data
Grant 8,011,011 - Sakaguchi August 30, 2 | 2011-08-30 |
Screening Apparatus, Screening Method, And Program
App 20110172941 - SAKAGUCHI; Kazuhiro | 2011-07-14 |
Information processing device, information processing method, and control program
Grant 7,970,817 - Hagiuda , et al. June 28, 2 | 2011-06-28 |
Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
Grant 7,483,799 - Sakaguchi January 27, 2 | 2009-01-27 |
Data processing apparatus, data processing method, and computer program
App 20060059093 - Takaragi; Yoichi ; et al. | 2006-03-16 |
Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
Grant 6,996,489 - Sakaguchi February 7, 2 | 2006-02-07 |
Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
App 20060007226 - Sakaguchi; Kazuhiro | 2006-01-12 |
Observation and/or failure inspection apparatus, method and program therefor
Grant 6,973,395 - Yoshizawa , et al. December 6, 2 | 2005-12-06 |
Information processing device, information processing method, and control program
App 20050257126 - Hagiuda, Tadashi ; et al. | 2005-11-17 |
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
Grant 6,931,336 - Sakaguchi August 16, 2 | 2005-08-16 |
Method and apparatus for processing data
App 20050160068 - Sakaguchi, Kazuhiro | 2005-07-21 |
Integrated circuit fault tester, integrated circuit fault test method and recording medium recorded with fault test control program
Grant 6,766,485 - Sakaguchi July 20, 2 | 2004-07-20 |
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
Grant 6,704,675 - Sakaguchi March 9, 2 | 2004-03-09 |
Observation and/or failure inspection apparatus, method and program therefor
App 20040034490 - Yoshizawa, Yutaka ; et al. | 2004-02-19 |
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
Grant 6,694,274 - Sakaguchi February 17, 2 | 2004-02-17 |
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
Grant 6,684,170 - Sakaguchi January 27, 2 | 2004-01-27 |
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
App 20030182073 - Sakaguchi, Kazuhiro | 2003-09-25 |
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
App 20030093237 - Sakaguchi, Kazuhiro | 2003-05-15 |
Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same
App 20030088380 - Sakaguchi, Kazuhiro | 2003-05-08 |
High speed LSI spectral analysis testing apparatus and method
Grant 6,351,835 - Sakaguchi February 26, 2 | 2002-02-26 |
Image formation system, control method of image formation system, image formation apparatus and storage medium thereof
App 20010051052 - Terao, Yoshihide ; et al. | 2001-12-13 |
Screening of semiconductor integrated circuit devices
App 20010043079 - Sakaguchi, Kazuhiro | 2001-11-22 |
Method and apparatus for sampling a power supply current of an integrated circuit, and storage medium onto which is recorded a control program therefor
App 20010020283 - Sakaguchi, Kazuhiro | 2001-09-06 |
Method and apparatus for diagnosing failure occurrence position
Grant 6,205,559 - Sakaguchi March 20, 2 | 2001-03-20 |
Integrated circuit fault testing system based on power spectrum analysis of power supply current
Grant 5,949,798 - Sakaguchi September 7, 1 | 1999-09-07 |
Electronic circuit tester and method of testing electronic circuit
Grant 5,801,540 - Sakaguchi September 1, 1 | 1998-09-01 |
CMOS integrated circuit failure diagnosis apparatus and diagnostic method
Grant 5,790,565 - Sakaguchi August 4, 1 | 1998-08-04 |
Electronic circuit tester and method of testing electronic circuit
Grant 5,659,244 - Sakaguchi August 19, 1 | 1997-08-19 |
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