Sakagawa; Hideo
Patent Applications and Registrations
Patent applications and USPTO patent grants for Sakagawa; Hideo.The latest application filed is for "probing method and prober".
- Sakagawa; Hideo - Nirasaki JP
- Sakagawa, Hideo - Nirasaki-Shi JP
| Patent | Date |
|---|---|
| Probing method and prober for measuring electrical characteristics of circuit devices Grant 7,417,445 - Sakagawa , et al. August 26, 2 | 2008-08-26 |
| Probing method and prober App 20050168232 - Sakagawa, Hideo ; et al. | 2005-08-04 |
| Probing method and prober Grant 6,906,542 - Sakagawa , et al. June 14, 2 | 2005-06-14 |
| Probing method and prober App 20040140820 - Sakagawa, Hideo ; et al. | 2004-07-22 |
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