Saitou; Norio

Patent Applications and Registrations

Patent applications and USPTO patent grants for Saitou; Norio.The latest application filed is for "person monitoring system and person monitoring method".

Company Profile

3.24.13

Saitou; Norio - Kanagawa JP
Saitou; Norio - Fukuoka JP
Saitou; Norio - Shizuoka JP
Saitou; Norio - Fukushima-Ken JP
Saitou; Norio - Tokorozawa JP
Saitou; Norio - Iruma JP
Saitou; Norio - Kokubunji JA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Person monitoring system and person monitoring method Grant 11,450,186 - Kamio , et al. September 20, 2	2022-09-20
Person Monitoring System And Person Monitoring Method App 20200380833 - KAMIO; Takashi ; et al.	2020-12-03
Flying object detection system and flying object detection method Grant 10,791,395 - Kamio , et al. September 29, 2	2020-09-29
Facial recognition system, facial recognition server, and facial recognition method Grant 10,592,731 - Tsuneno , et al.	2020-03-17
Flying Object Detection System And Flying Object Detection Method App 20200045416 - KAMIO; Takashi ; et al.	2020-02-06
Sound processing apparatus, sound processing system and sound processing method Grant 10,182,280 - Kishimoto , et al. Ja	2019-01-15
Facial Recognition System, Facial Recognition Server, And Facial Recognition Method App 20180157898 - TSUNENO; Masashige ; et al.	2018-06-07
Skin Patch Instrument For Treating Pain App 20170079867 - Saitou; Norio	2017-03-23
Sound Processing Apparatus, Sound Processing System And Sound Processing Method App 20150312662 - KISHIMOTO; Michinori ; et al.	2015-10-29
Sound Processing Apparatus, Sound Processing System And Sound Processing Method App 20150281832 - KISHIMOTO; Michinori ; et al.	2015-10-01
Skin Patch Instrument For Treating Pain App 20140364760 - Saitou; Norio	2014-12-11
Skin Patch Instrument For Treating Pain App 20140316457 - Saitou; Norio	2014-10-23
Skin patch instrument for treating pain Grant 8,827,966 - Saitou September 9, 2	2014-09-09
Skin Patch Instrument For Treating Pain App 20110046580 - Saitou; Norio	2011-02-24
Method of continuously cleansing polyarylene sulfide Grant 7,094,867 - Miyahara , et al. August 22, 2	2006-08-22
Charged particle beam exposure method and apparatus and device manufacturing method using the apparatus Grant 6,946,665 - Muraki , et al. September 20, 2	2005-09-20
Method of continuously cleansing polyarylene sulfide App 20050087215 - Miyahara, Michihisa ; et al.	2005-04-28
Charged particle beam exposure method and apparatus and device manufacturing method using the apparatus App 20050029473 - Muraki, Masato ; et al.	2005-02-10
Electron beam monitoring sensor and electron beam monitoring method Grant 6,768,118 - Nakayama , et al. July 27, 2	2004-07-27
Electron beam lithography apparatus Grant 6,730,916 - Tsuji , et al. May 4, 2	2004-05-04
Electron beam monitoring sensor and electron beam monitoring method App 20040026627 - Nakayama, Yoshinori ; et al.	2004-02-12
Electron beam exposure method, electron beam exposure apparatus and device manufacturing method using the same Grant 6,667,486 - Ohta , et al. December 23, 2	2003-12-23
Electron Beam Exposure Method, Electron Beam Exposure Apparatus And Device Manufacturing Method Using The Same App 20030189181 - Ohta, Hiroya ; et al.	2003-10-09
Electron beam lithography apparatus and pattern forming method Grant 6,511,048 - Sohda , et al. January 28, 2	2003-01-28
Exposure method and pattern data preparation system therefor, pattern data preparation method and mask as well as exposure apparatus Grant 5,557,314 - Okamoto , et al. September 17, 1	1996-09-17
Methods for measuring optical system, and method and apparatus for exposure using said measuring method Grant 5,420,436 - Seya , et al. May 30, 1	1995-05-30
Method and apparatus of fabricating electric circuit pattern on thick and thin film hybrid multilayer wiring substrate Grant 5,162,240 - Saitou , et al. November 10, 1	1992-11-10
Electron beam lithography system Grant 4,943,729 - Ando , et al. July 24, 1	1990-07-24
Charged particle beam lithography system Grant 4,829,444 - Saitou , et al. May 9, 1	1989-05-09
Lithography apparatus Grant 4,820,928 - Ooyama , et al. April 11, 1	1989-04-11
Hybrid charged particle apparatus Grant 4,740,698 - Tamura , et al. April 26, 1	1988-04-26
Electron beam lithography apparatus Grant 4,692,579 - Saitou , et al. September 8, 1	1987-09-08
Apparatus for electron beam lithography Grant 4,577,111 - Saitou , et al. March 18, 1	1986-03-18
Shaping aperture for a charged particle forming system Grant 4,445,040 - Iwasaki , et al. April 24, 1	1984-04-24
Method and apparatus of deflection calibration for a charged particle beam exposure apparatus Grant 4,443,703 - Shimazu , et al. April 17, 1	1984-04-17
Multi Electron Beam Apparatus Grant 3,715,580 - Maekawa , et al. February 6, 1	1973-02-06

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