Saito; Yasuko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Saito; Yasuko.The latest application filed is for "pattern inspection apparatus and method and workpiece tested thereby".

Company Profile

0.5.7

Saito; Yasuko - Tokyo JP
Saito; Yasuko - Minato-ku JP
Saito; Yasuko - Kanagawa JP
Saito; Yasuko - Sendai JP
Saito, Yasuko - Sendai-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Photomask manufacturing support system Grant 7,664,307 - Saito February 16, 2	2010-02-16
Early error detection during fabrication of reticles Grant 7,577,287 - Saito August 18, 2	2009-08-18
Method, system, apparatus and program for programming defect data for evaluation of reticle inspection apparatus Grant 7,441,226 - Saito October 21, 2	2008-10-21
Workpiece inspection apparatus assisting device, workpiece inspection method and computer-readable recording media storing program therefor Grant 7,275,006 - Tsuji , et al. September 25, 2	2007-09-25
Pattern inspection apparatus and method and workpiece tested thereby App 20070165938 - Matsumura; Kenichi ; et al.	2007-07-19
Workpiece inspection apparatus assisting device, workpiece inspection method and computer-readable recording media storing program therefor App 20070055467 - Tsuji; Yoshitake ; et al.	2007-03-08
Method of non-destructive inspection of rear surface flaws and material characteristics using electromagnetic technique and apparatus therefor Grant 7,123,004 - Saka , et al. October 17, 2	2006-10-17
Early error detection during fabrication of reticles App 20060039594 - Saito; Yasuko	2006-02-23
Photomask manufacturing support system App 20050223349 - Saito, Yasuko	2005-10-06
Method of non-destructive inspection of rear surface flaws and material characteristics using electromagnetic technique and apparatus therefor App 20050212514 - Saka, Masumi ; et al.	2005-09-29
Method, system, apparatus and program for programming defect data for evaluation of reticle inspection apparatus App 20040230883 - Saito, Yasuko	2004-11-18
Semiconductor nanoparticles and thin film containing the same App 20040007169 - Ohtsu, Takeshi ; et al.	2004-01-15

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