Saidin; Zain

Patent Applications and Registrations

Patent applications and USPTO patent grants for Saidin; Zain.The latest application filed is for "apparatus and methods for real-time three-dimensional sem imaging and viewing of semiconductor wafers".

Company Profile

0.7.10

Saidin; Zain - San Mateo CA
Saidin; Zain - Sunnyvale CA
Saidin; Zain - Kailua HI

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for detecting design and process defects on a wafer using process monitoring features Grant 9,710,903 - Fouquet , et al. July 18, 2	2017-07-18
Unique mark and method to determine critical dimension uniformity and registration of reticles combined with wafer overlay capability Grant 8,804,137 - Choi , et al. August 12, 2	2014-08-12
Apparatus And Methods For Real-time Three-dimensional Sem Imaging And Viewing Of Semiconductor Wafers App 20120223227 - CHEN; Chien-Huei ; et al.	2012-09-06
Systems And Methods For Detecting Design And Process Defects On A Wafer, Reviewing Defects On A Wafer, Selecting One Or More Features Within A Design For Use As Process Monitoring Features, Or Some Combination Thereof App 20110276935 - Fouquet; Christophe ; et al.	2011-11-10
Unique Mark And Method To Determine Critical Dimension Uniformity And Registration Of Reticles Combined With Wafer Overlay Capability App 20110051150 - Choi; DongSub ; et al.	2011-03-03
System and method for determing reticle defect printability App 20090324054 - Vacca; Anthony ; et al.	2009-12-31
System and method for determining reticle defect printability App 20080133160 - Vacca; Anthony ; et al.	2008-06-05
System and method for determining reticle defect printability App 20070140548 - Vacca; Anthony ; et al.	2007-06-21
System and method for determining reticle defect printability App 20050140970 - Vacca, Anthony ; et al.	2005-06-30
System and method for determining reticle defect printability App 20040096094 - Vacca, Anthony ; et al.	2004-05-20
System and method for determining reticle defect printability Grant 6,731,787 - Vacca , et al. May 4, 2	2004-05-04
System and method for determining reticle defect printability App 20030138138 - Vacca, Anthony ; et al.	2003-07-24
System and method for determining reticle defect printability App 20020126888 - Vacca, Anthony ; et al.	2002-09-12
System and method for determining reticle defect printability Grant 6,076,465 - Vacca , et al. June 20, 2	2000-06-20
Method of three-phase winding motor control of rotary motor-driven linear actuators, linear motor-actuated carriages, and similar systems, and apparatus for practicing the same Grant 5,023,528 - Saidin , et al. June 11, 1	1991-06-11

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