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Patent applications and USPTO patent grants for Sahouria; Emile.The latest application filed is for "data flow branching in mask data preparation".
Patent | Date |
---|---|
Data flow branching in mask data preparation Grant 8,635,562 - Sahouria January 21, 2 | 2014-01-21 |
Mask model calibration technologies involving etch effect and exposure effect Grant 8,516,401 - Sahouria , et al. August 20, 2 | 2013-08-20 |
Joint Calibration for Mask Process Models App 20100218161 - Sahouria; Emile ;   et al. | 2010-08-26 |
Data Flow Branching in Mask Data Preparation App 20100218159 - Sahouria; Emile | 2010-08-26 |
Fracture Shot Count Reduction App 20090070732 - Sahouria; Emile ;   et al. | 2009-03-12 |
Convergence technique for model-based optical and process correction Grant 7,367,009 - Cobb , et al. April 29, 2 | 2008-04-29 |
Selective promotion for resolution enhancement techniques Grant 7,240,321 - Cobb , et al. July 3, 2 | 2007-07-03 |
Convergence technique for model-based optical and process correction App 20060236298 - Cobb; Nicolas Bailey ;   et al. | 2006-10-19 |
Convergence technique for model-based optical and process correction Grant 7,028,284 - Cobb , et al. April 11, 2 | 2006-04-11 |
Integrated verification and manufacturability tool Grant 7,017,141 - Anderson , et al. March 21, 2 | 2006-03-21 |
Data management method for mask writing Grant 6,901,574 - LaCour , et al. May 31, 2 | 2005-05-31 |
Selective promotion for resolution enhancement techniques App 20040230936 - Cobb, Nicolas B. ;   et al. | 2004-11-18 |
Convergence technique for model-based optical and process correction App 20040216065 - Cobb, Nicolas Bailey ;   et al. | 2004-10-28 |
Selective promotion for resolution enhancement techniques Grant 6,668,367 - Cobb , et al. December 23, 2 | 2003-12-23 |
Selective promotion for resolution enhancement techniques App 20030140328 - Cobb, Nicolas B. ;   et al. | 2003-07-24 |
Integrated circuit design correction using fragment correspondence Grant 6,516,459 - Sahouria February 4, 2 | 2003-02-04 |
Data management method for reticle/mask writing App 20020157068 - LaCour, Patrick J. ;   et al. | 2002-10-24 |
Integrated verification and manufacturability tool App 20020100005 - Anderson, Leigh C. ;   et al. | 2002-07-25 |
Integrated verification and manufacturability tool Grant 6,425,113 - Anderson , et al. July 23, 2 | 2002-07-23 |
Integrated verification and manufacturability tool Grant 6,415,421 - Anderson , et al. July 2, 2 | 2002-07-02 |
Integrated verification and manufacturability tool App 20010052107 - Anderson, Leigh C. ;   et al. | 2001-12-13 |
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