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Patent applications and USPTO patent grants for Safwat; Amr M. E..The latest application filed is for "probe for testing a device under test".
Patent | Date |
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Shielded probe for testing a device under test Grant 7,518,387 - Gleason , et al. April 14, 2 | 2009-04-14 |
Shielded probe for testing a device under test Grant 7,489,149 - Gleason , et al. February 10, 2 | 2009-02-10 |
Shielded probe for testing a device under test Grant 7,482,823 - Gleason , et al. January 27, 2 | 2009-01-27 |
Shielded probe with low contact resistance for testing a device under test Grant 7,436,194 - Gleason , et al. October 14, 2 | 2008-10-14 |
Probe for testing a device under test App 20080054929 - Gleason; K. Reed ;   et al. | 2008-03-06 |
Probe for testing a device under test App 20080054923 - Gleason; K. Reed ;   et al. | 2008-03-06 |
Test structures and method for interconnect impedance property extraction Grant 7,340,703 - Hegazy , et al. March 4, 2 | 2008-03-04 |
Probe for testing a device under test App 20080048692 - Gleason; K. Reed ;   et al. | 2008-02-28 |
Probe for testing a device under test App 20080024149 - Gleason; K. Reed ;   et al. | 2008-01-31 |
Shielded probe for high-frequency testing of a device under test Grant 7,304,488 - Gleason , et al. December 4, 2 | 2007-12-04 |
Probe for testing a device under test App 20070075716 - Gleason; K. Reed ;   et al. | 2007-04-05 |
Probe for testing a device under test Grant 7,161,363 - Gleason , et al. January 9, 2 | 2007-01-09 |
Test structures and method for interconnect impedance property extraction App 20060022678 - Hegazy; Hazem Mahmoud ;   et al. | 2006-02-02 |
Probe for testing a device under test App 20040232927 - Gleason, K. Reed ;   et al. | 2004-11-25 |
Probe for testing a device under test Grant 6,815,963 - Gleason , et al. November 9, 2 | 2004-11-09 |
Probe for testing a device under test App 20040004491 - Gleason, K. Reed ;   et al. | 2004-01-08 |
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