loadpatents
name:-0.0075259208679199
name:-0.011282920837402
name:-0.00043797492980957
Safwat; Amr M. E. Patent Filings

Safwat; Amr M. E.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Safwat; Amr M. E..The latest application filed is for "probe for testing a device under test".

Company Profile
0.8.8
  • Safwat; Amr M. E. - Cairo EG
  • Safwat; Amr M. E. - Elgiza EG
  • Safwat; Amr M.E. - Cario EG
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Shielded probe for testing a device under test
Grant 7,518,387 - Gleason , et al. April 14, 2
2009-04-14
Shielded probe for testing a device under test
Grant 7,489,149 - Gleason , et al. February 10, 2
2009-02-10
Shielded probe for testing a device under test
Grant 7,482,823 - Gleason , et al. January 27, 2
2009-01-27
Shielded probe with low contact resistance for testing a device under test
Grant 7,436,194 - Gleason , et al. October 14, 2
2008-10-14
Probe for testing a device under test
App 20080054929 - Gleason; K. Reed ;   et al.
2008-03-06
Probe for testing a device under test
App 20080054923 - Gleason; K. Reed ;   et al.
2008-03-06
Test structures and method for interconnect impedance property extraction
Grant 7,340,703 - Hegazy , et al. March 4, 2
2008-03-04
Probe for testing a device under test
App 20080048692 - Gleason; K. Reed ;   et al.
2008-02-28
Probe for testing a device under test
App 20080024149 - Gleason; K. Reed ;   et al.
2008-01-31
Shielded probe for high-frequency testing of a device under test
Grant 7,304,488 - Gleason , et al. December 4, 2
2007-12-04
Probe for testing a device under test
App 20070075716 - Gleason; K. Reed ;   et al.
2007-04-05
Probe for testing a device under test
Grant 7,161,363 - Gleason , et al. January 9, 2
2007-01-09
Test structures and method for interconnect impedance property extraction
App 20060022678 - Hegazy; Hazem Mahmoud ;   et al.
2006-02-02
Probe for testing a device under test
App 20040232927 - Gleason, K. Reed ;   et al.
2004-11-25
Probe for testing a device under test
Grant 6,815,963 - Gleason , et al. November 9, 2
2004-11-09
Probe for testing a device under test
App 20040004491 - Gleason, K. Reed ;   et al.
2004-01-08

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