Ryu; Kwan-Woo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ryu; Kwan-Woo.The latest application filed is for "apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film".

Company Profile

0.7.7

Ryu; Kwan-Woo - Seoul KR
Ryu; Kwan-Woo - Hwaseong-si N/A KR
Ryu; Kwan-Woo - Suwon-si KR
Ryu; Kwan-Woo - Suwon KR
Ryu, Kwan-Woo - Suwon-city KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus for measuring thickness of thin film, system including the apparatus, and method for measuring thickness of thin film Grant 9,417,055 - Ryu , et al. August 16, 2	2016-08-16
Apparatus For Measuring Thickness Of Thin Film, System Including The Apparatus, And Method For Measuring Thickness Of Thin Film App 20160061583 - RYU; Sung-Yoon ; et al.	2016-03-03
Method for measuring thickness of object Grant 9,255,789 - Park , et al. February 9, 2	2016-02-09
Method For Measuring Thickness Of Object App 20150029517 - PARK; Jang-Ik ; et al.	2015-01-29
Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis Grant 8,551,791 - Park , et al. October 8, 2	2013-10-08
Apparatus and method for manufacturing semiconductor devices through layer material dimension analysis App 20090325326 - Park; Jang-Ik ; et al.	2009-12-31
Apparatus for monitoring a density profile of impurities App 20070222999 - Lee; Yun-Jung ; et al.	2007-09-27
Method for monitoring a density profile of impurities Grant 7,186,577 - Jee , et al. March 6, 2	2007-03-06
Method and apparatus for measuring contamination of a semiconductor substrate Grant 6,927,077 - Eom , et al. August 9, 2	2005-08-09
Method and apparatus for detecting contaminants in ion-implanted wafer Grant 6,869,215 - Yang , et al. March 22, 2	2005-03-22
Method and apparatus for monitoring a density profile of impurities App 20040253750 - Jee, Yun-Jung ; et al.	2004-12-16
Method and apparatus for detecting contaminants in ion-implanted wafer App 20040105486 - Yang, Yu-Sin ; et al.	2004-06-03
Method and apparatus for measuring contamination of a semiconductor substrate App 20040100298 - Eom, Tae-Min ; et al.	2004-05-27

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