Ryoden Semiconductor System Engineering Corporation

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ryoden Semiconductor System Engineering Corporation.The latest application filed is for "semiconductor memory device with built-in self test circuit operating at high rate".

Company Profile

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Ryoden Semiconductor System Engineering Corporation - Hyogo JP
Ryoden Semiconductor System Engineering Corporation - Itami JP
Ryoden Semiconductor System Engineering Corporation - both of JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor memory device with built-in self test circuit operating at high rate Grant 6,993,696 - Tanizaki , et al. January 31, 2	2006-01-31
Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal Grant 6,934,648 - Hanai , et al. August 23, 2	2005-08-23
Power module Grant 6,900,986 - Kimoto , et al. May 31, 2	2005-05-31
Semiconductor device and method of manufacturing the same Grant 6,864,580 - Nakazawa , et al. March 8, 2	2005-03-08
Method of manufacturing semiconductor device and flash memory Grant 6,841,487 - Yuzuriha , et al. January 11, 2	2005-01-11
Substrate carrier management system and program Grant 6,823,229 - Ootani , et al. November 23, 2	2004-11-23
Method of fabricating a semiconductor device with a passivation film Grant 6,815,265 - Nakatani , et al. November 9, 2	2004-11-09
Manufacturing method of semiconductor device Grant 6,808,973 - Ootsu , et al. October 26, 2	2004-10-26
Test pattern generation circuit and method for use with self-diagnostic circuit Grant 6,802,034 - Matsuo , et al. October 5, 2	2004-10-05
Process control device and process control method Grant 6,788,990 - Yanaru , et al. September 7, 2	2004-09-07
Power module Grant 6,762,937 - Kimoto , et al. July 13, 2	2004-07-13
Substrate testing apparatus and substrate testing method Grant 6,747,466 - Sugimoto , et al. June 8, 2	2004-06-08
Method of interbay transportation Grant 6,733,243 - Ogata , et al. May 11, 2	2004-05-11
Semiconductor device provided with memory chips Grant 6,724,668 - Ohmura , et al. April 20, 2	2004-04-20
Track conveyance system Grant 6,721,627 - Udou , et al. April 13, 2	2004-04-13
Method of producing a semiconductor device Grant 6,716,718 - Nagatani , et al. April 6, 2	2004-04-06
Apparatus for testing semiconductor integrated circuit Grant 6,714,888 - Mori , et al. March 30, 2	2004-03-30
Method for preparing manufacturing plan and method for manufacturing semiconductor products using the manufacturing plan Grant 6,708,070 - Yasuda , et al. March 16, 2	2004-03-16
Semiconductor module Grant 6,708,302 - Shibayama , et al. March 16, 2	2004-03-16
Semiconductor device having S/D to S/D connection and isolation region between two semiconductor elements Grant 6,696,732 - Matsuoka , et al. February 24, 2	2004-02-24
Field effect transistor having improved withstand voltage Grant 6,696,727 - Takahara February 24, 2	2004-02-24
Apparatus and method for testing semiconductor integrated circuit Grant 6,690,189 - Mori , et al. February 10, 2	2004-02-10
Transportation system Grant 6,687,568 - Ohtsuka , et al. February 3, 2	2004-02-03
Tester for semiconductor integrated circuits Grant 6,661,248 - Mori , et al. December 9, 2	2003-12-09
External test auxiliary device to be used for testing semiconductor device Grant 6,653,855 - Mori , et al. November 25, 2	2003-11-25
Semiconductor test apparatus, and method of testing semiconductor device Grant 6,651,023 - Mori , et al. November 18, 2	2003-11-18
Semiconductor device and manufacturing method thereof Grant 6,645,859 - Sawada , et al. November 11, 2	2003-11-11
Method and apparatus for testing semiconductor devices using improved testing sequence Grant 6,646,461 - Sugiura , et al. November 11, 2	2003-11-11
Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits Grant 6,642,736 - Mori , et al. November 4, 2	2003-11-04
Insulated gate semiconductor device having first trench and second trench connected to the same Grant 6,642,600 - Narazaki , et al. November 4, 2	2003-11-04
Semiconductor device having a device formation region protected from a counterelectromotive force Grant 6,639,294 - Furuya , et al. October 28, 2	2003-10-28
Semiconductor device and method of fabricating the same Grant 6,638,806 - Igarashi , et al. October 28, 2	2003-10-28
Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing Grant 6,634,004 - Yamada , et al. October 14, 2	2003-10-14
Apparatus and method for testing semiconductor integrated circuit Grant 6,628,137 - Mori , et al. September 30, 2	2003-09-30
Method of manufacturing a semiconductor device having an improved fine structure Grant 6,593,063 - Tanaka , et al. July 15, 2	2003-07-15
Semiconductor test apparatus and method Grant 6,587,975 - Mori , et al. July 1, 2	2003-07-01
Sampling inspection managing system Grant 6,577,972 - Yanaru , et al. June 10, 2	2003-06-10
Method of manufacturing a semiconductor device and semiconductor device manufactured by the method Grant 6,566,040 - Sugino , et al. May 20, 2	2003-05-20
Semiconductor manufacturing apparatus, method for cleaning the semiconductor manufacturing apparatus, and light source unit Grant 6,555,790 - Ono , et al. April 29, 2	2003-04-29
Power module Grant 6,522,544 - Kimoto , et al. February 18, 2	2003-02-18
Test system and testing method using memory tester Grant 6,492,923 - Inoue , et al. December 10, 2	2002-12-10
Process control device and process control method permitting processing order and processing condition to be changed while manufacturing process continues Grant 6,480,755 - Ootani , et al. November 12, 2	2002-11-12
Method of fabricating a semiconductor device Grant 6,444,515 - Matsuo , et al. September 3, 2	2002-09-03
Method and apparatus for manufacturing semiconductor device Grant 6,380,058 - Manabe , et al. April 30, 2	2002-04-30
Repair analysis circuit for redundancy, redundant repairing method, and semiconductor device Grant 6,345,004 - Omura , et al. February 5, 2	2002-02-05
Semiconductor integrated circuit having built-in self-test circuit Grant 6,335,645 - Matsuo , et al. January 1, 2	2002-01-01
Insulated gate semiconductor device and method of manufacturing the same Grant 6,285,058 - Narazaki , et al. September 4, 2	2001-09-04
Prober and electric evaluation method of semiconductor device Grant 6,194,907 - Kanao , et al. February 27, 2	2001-02-27
Thin-film transistor and method of manufacturing the same Grant 6,103,556 - Nishimura , et al. August 15, 2	2000-08-15
Washing apparatus and washing method Grant 6,048,409 - Kanno , et al. April 11, 2	2000-04-11
Method of manufacturing semiconductor device having bipolar transistor and field-effect transistor Grant 6,027,962 - Igarashi , et al. February 22, 2	2000-02-22
System for analyzing a failure in a semiconductor wafer by calculating correlation coefficient between collated data of defects per prescribed unit and failures per prescribed unit Grant 6,009,545 - Tsutsui , et al. December 28, 1	1999-12-28
Method of manufacturing semiconductor device Grant 5,994,227 - Matsuo , et al. November 30, 1	1999-11-30
Power semiconductor device and method for manufacturing the same Grant 5,929,482 - Kawakami , et al. July 27, 1	1999-07-27
Failure analyzer Grant 5,905,650 - Tsutsui , et al. May 18, 1	1999-05-18
Apparatus for analyzing a failure in a semiconductor wafer and method thereof Grant 5,844,850 - Tsutsui , et al. December 1, 1	1998-12-01
Liquid vaporizing apparatus Grant 5,803,938 - Yamaguchi , et al. September 8, 1	1998-09-08
Liquid vaporizing apparatus Grant 5,785,902 - Yamaguchi , et al. July 28, 1	1998-07-28
Apparatus for stripping pellicle Grant 5,772,842 - Tanaka , et al. June 30, 1	1998-06-30
Field effect thin-film transistor and method of manufacturing the same as well as semiconductor device provided with the same Grant 5,736,438 - Nishimura , et al. April 7, 1	1998-04-07
Stream drying process Grant 5,709,037 - Tanaka , et al. January 20, 1	1998-01-20
Flip chip semiconductor device Grant 5,666,008 - Tomita , et al. September 9, 1	1997-09-09
Liquid vaporizing apparatus Grant 5,662,838 - Yamaguchi , et al. September 2, 1	1997-09-02
Method of using scanning probe microscope allowing cleaning of probe tip in ambient atmosphere Grant 5,652,428 - Nishioka , et al. July 29, 1	1997-07-29
Method of forming fine patterns Grant 5,595,941 - Okamoto , et al. January 21, 1	1997-01-21
Liquid vaporizing apparatus Grant 5,520,858 - Yamaguchi , et al. May 28, 1	1996-05-28
Field effect thin-film transistor for an SRAM with reduced standby current Grant 5,514,880 - Nishimura , et al. May 7, 1	1996-05-07
Semiconductor wafer inspection apparatus Grant 5,465,145 - Nakashige , et al. November 7, 1	1995-11-07