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name:-0.0082008838653564
name:-0.00060296058654785
Rygiel; Reiner Patent Filings

Rygiel; Reiner

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rygiel; Reiner.The latest application filed is for "confocal laser scanning microscope and a method for examining a sample".

Company Profile
0.8.8
  • Rygiel; Reiner - Altrip DE
  • Rygiel; Reiner - Dossenheim DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Confocal laser scanning microscope and a method for investigating a sample
Grant 8,922,776 - Rygiel December 30, 2
2014-12-30
Confocal Laser Scanning Microscope And A Method For Examining A Sample
App 20130342834 - Rygiel; Reiner
2013-12-26
Arrangement for determining the distance, capacitive distance sensor and method for automatically focussing a microscope
Grant 7,924,027 - Sieckmann , et al. April 12, 2
2011-04-12
Sampler carrier for a confocal microscope and method for fabricating a sample carrier
Grant 7,583,436 - Rygiel September 1, 2
2009-09-01
Device and method for adjusting two objective lenses in 4Pi-system
Grant 7,477,448 - Rygiel January 13, 2
2009-01-13
4Pi microscope
Grant 7,453,578 - Leimbach , et al. November 18, 2
2008-11-18
Fine Tuning Device
App 20080130104 - Seifert; Roland ;   et al.
2008-06-05
Arrangement for Determining the Distance, Capacitive Distance Sensor and Method for Automatically Focussing a Microscope
App 20080068028 - Sieckmann; Frank ;   et al.
2008-03-20
Device and method for adjusting two object lenses in 4pi-system
App 20070153366 - Rygiel; Reiner
2007-07-05
4Pi microscope
App 20070052972 - Leimbach; Volker ;   et al.
2007-03-08
Beam deflection device
Grant 7,177,058 - Rygiel February 13, 2
2007-02-13
Beam deflection device
App 20050036186 - Rygiel, Reiner
2005-02-17
Sample carrier for a confocal microscope and method for fabricating a sample carrier
App 20040087006 - Rygiel, Reiner
2004-05-06
Method and apparatus for the interferometric examination of scattering objects
Grant 6,611,338 - Knuttel , et al. August 26, 2
2003-08-26

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