Runyon; Rex

Patent Applications and Registrations

Patent applications and USPTO patent grants for Runyon; Rex.The latest application filed is for "interleaved acousto-optical device scanning for suppression of optical crosstalk".

Company Profile

0.10.8

Runyon; Rex - Fremont CA
Runyon; Rex - N/A
Runyon; Rex - Fremon CA
Runyon; Rex - US
Runyon; Rex - Milpitas CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Interleaved acousto-optical device scanning for suppression of optical crosstalk Grant 10,060,884 - Sullivan , et al. August 28, 2	2018-08-28
System and method for apodization in a semiconductor device inspection system Grant 9,645,093 - Sullivan , et al. May 9, 2	2017-05-09
Interleaved Acousto-Optical Device Scanning For Suppression Of Optical Crosstalk App 20160290971 - Sullivan; Jamie ; et al.	2016-10-06
Interleaved acousto-optical device scanning for suppression of optical crosstalk Grant 9,395,340 - Sullivan , et al. July 19, 2	2016-07-19
System and Method for Apodization in a Semiconductor Device Inspection System App 20160054232 - Sullivan; Jamie M. ; et al.	2016-02-25
System and method for apodization in a semiconductor device inspection system Grant 9,176,069 - Sullivan , et al. November 3, 2	2015-11-03
Interleaved Acousto-Optical Device Scanning For Suppression Of Optical Crosstalk App 20140260640 - Sullivan; Jamie ; et al.	2014-09-18
System and Method for Apodization in a Semiconductor Device Inspection System App 20140016125 - Sullivan; Jamie M. ; et al.	2014-01-16
Electron beam column and methods of using same Grant 8,461,526 - Mankos , et al. June 11, 2	2013-06-11
High-sensitivity and high-throughput electron beam inspection column enabled by adjustable beam-limiting aperture Grant 8,294,125 - Han , et al. October 23, 2	2012-10-23
Electron Beam Column And Methods Of Using Same App 20120138791 - MANKOS; Marian ; et al.	2012-06-07
Multi-spot scanning system and method Grant 8,194,301 - Zhao , et al. June 5, 2	2012-06-05
High-Sensitivity and High-Throughput Electron Beam Inspection Column Enabled by Adjustable Beam-Limiting Aperture App 20110114838 - HAN; Liqun ; et al.	2011-05-19
Multi-spot scanning system and method App 20090225399 - Zhao; Guoheng ; et al.	2009-09-10
Two-dimensional UV compatible programmable spatial filter Grant 6,686,995 - Wilk , et al. February 3, 2	2004-02-03
UV compatible programmable spatial filter Grant 6,686,994 - Wilk , et al. February 3, 2	2004-02-03
Two-dimensional Uv Compatible Programmable Spatial Filter App 20040001198 - Wilk, Dieter E. ; et al.	2004-01-01

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.