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name:-0.0048069953918457
name:-0.0055088996887207
name:-0.0015971660614014
Runkowske; Holger Patent Filings

Runkowske; Holger

Patent Applications and Registrations

Patent applications and USPTO patent grants for Runkowske; Holger.The latest application filed is for "magnetic field measuring device with vibration compensation".

Company Profile
0.4.7
  • Runkowske; Holger - Probsteierhagen DE
  • Runkowske, Holger - Fahren DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Magnetic field measuring device with vibration compensation
Grant 9,810,749 - Jahns , et al. November 7, 2
2017-11-07
Magnetic Field Measuring Device With Vibration Compensation
App 20160116552 - Jahns; Robert ;   et al.
2016-04-28
Method And Device For Measuring A Running Direction Of A Substrate Web
App 20120260813 - Neuber; Ingo ;   et al.
2012-10-18
Method for the control of a transport medium and a sensor device for a printing machine
App 20070041737 - Runkowske; Holger ;   et al.
2007-02-22
Method and imaging device for adjusting a printing head
App 20050225587 - Hoffmann, Uwe ;   et al.
2005-10-13
Procedure and device for adjusting gloss in print material
Grant 6,950,615 - Jung , et al. September 27, 2
2005-09-27
Procedure and device for adjusting gloss in print material
App 20050117929 - Jung, Eggert Joachim ;   et al.
2005-06-02
Gloss/density measurement device with feedback to control gloss and density of images produced by an electrographic reproduction apparatus
Grant 6,819,886 - Runkowske , et al. November 16, 2
2004-11-16
Gloss/density measurement device with feedback to control gloss and density of images produced by an electrographic reproduction apparatus
App 20040141764 - Runkowske, Holger ;   et al.
2004-07-22
Procedure and device for measuring the thickness of a liquid layer on a roller of a printing press
Grant 6,684,049 - Luxem , et al. January 27, 2
2004-01-27
Procedure and device for measuring the thickness of a liquid layer
App 20020131797 - Luxem, Wolfgang Eberhard ;   et al.
2002-09-19

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