Ruffell; John

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ruffell; John.The latest application filed is for "systems and methods for scanning a beam of charged particles".

Company Profile

0.9.5

Ruffell; John - Sunnyvale CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus and method for multi-directionally scanning a beam of charged particles Grant 8,481,959 - Ruffell July 9, 2	2013-07-09
Systems and methods for scanning a beam of charged particles Grant 8,399,851 - Ruffell March 19, 2	2013-03-19
Systems And Methods For Scanning A Beam Of Charged Particles App 20110186747 - Ruffell; John	2011-08-04
Systems And Methods For Scanning A Beam Of Charged Particles App 20110186748 - Ruffell; John	2011-08-04
Systems And Methods For Scanning A Beam Of Charged Particles App 20110186743 - Ruffell; John	2011-08-04
Method and apparatus for processing wafers App 20040221811 - Mitchell, Robert ; et al.	2004-11-11
Method and apparatus for processing wafers Grant 6,679,675 - Mitchell , et al. January 20, 2	2004-01-20
Determining beam alignment in ion implantation using Rutherford Back Scattering Grant 6,555,832 - Ryding , et al. April 29, 2	2003-04-29
Ion implanter and beam stop therefor Grant 6,525,327 - Mitchell , et al. February 25, 2	2003-02-25
Method and apparatus for processing wafers App 20020034433 - Mitchell, Robert J. C. ; et al.	2002-03-21
Method and apparatus for processing wafers Grant 6,350,097 - Mitchell , et al. February 26, 2	2002-02-26
Backside gas delivery system for a semiconductor wafer processing system Grant 6,179,921 - Ruffell , et al. January 30, 2	2001-01-30

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