loadpatents
Patent applications and USPTO patent grants for Routh, Jr.; Brian Roberts.The latest application filed is for "automated tem sample preparation".
Patent | Date |
---|---|
Method of material deposition Grant 11,069,523 - Routh, Jr. , et al. July 20, 2 | 2021-07-20 |
Automated TEM sample preparation Grant 10,825,651 - Brogden , et al. November 3, 2 | 2020-11-03 |
Automated Tem Sample Preparation App 20190272975 - Brogden; Valerie ;   et al. | 2019-09-05 |
Automated TEM sample preparation Grant 10,340,119 - Brogden , et al. | 2019-07-02 |
Method Of Material Deposition App 20180277361 - Routh, JR.; Brian Roberts ;   et al. | 2018-09-27 |
Preparation of lamellae for TEM viewing Grant 10,068,749 - Fuller , et al. September 4, 2 | 2018-09-04 |
Method of material deposition Grant 9,978,586 - Routh, Jr. , et al. May 22, 2 | 2018-05-22 |
Automated Tem Sample Preparation App 20170256380 - Brogden; Valerie ;   et al. | 2017-09-07 |
Method Of Material Deposition App 20170133220 - Routh, JR.; Brian Roberts ;   et al. | 2017-05-11 |
Source for selectively providing positively or negatively charged particles for a focusing column Grant 9,601,312 - Routh, Jr. March 21, 2 | 2017-03-21 |
Automated TEM sample preparation Grant 9,601,313 - Brogden , et al. March 21, 2 | 2017-03-21 |
Source For Selectively Providing Positively Or Negatively Charged Particles For A Focusing Column App 20160172156 - Routh, JR.; Brian Roberts | 2016-06-16 |
Automated Tem Sample Preparation App 20160141147 - Brogden; Valerie ;   et al. | 2016-05-19 |
High capacity TEM grid Grant 9,281,163 - Routh, Jr. , et al. March 8, 2 | 2016-03-08 |
Source for selectively providing positively or negatively charged particles for a focusing column Grant 9,275,828 - Routh, Jr. March 1, 2 | 2016-03-01 |
High Capacity TEM Grid App 20150294834 - Routh, JR.; Brian Roberts ;   et al. | 2015-10-15 |
Source for Selectively Providing Positively or Negatively Charged Particles for a Focusing Column App 20140326877 - Routh, JR.; Brian Roberts | 2014-11-06 |
Method of preparing and imaging a lamella in a particle-optical apparatus Grant 8,766,214 - Routh, Jr. , et al. July 1, 2 | 2014-07-01 |
Inductively coupled plasma source as an electron beam source for spectroscopic analysis Grant 8,716,673 - Routh, Jr. May 6, 2 | 2014-05-06 |
Method Of Preparing And Imaging A Lamella In A Particle-optical Apparatus App 20140007307 - Routh, JR.; Brian Roberts ;   et al. | 2014-01-02 |
Preparation Of Lamellae For Tem Viewing App 20130319849 - Fuller; Scott Edward ;   et al. | 2013-12-05 |
Inductively Coupled Plasma Source as an Electron Beam Source for Spectroscopic Analysis App 20130134307 - Routh, JR.; Brian Roberts | 2013-05-30 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.