Rotter; Lawrence D.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rotter; Lawrence D..The latest application filed is for "optical metrology tool equipped with modulated illumination sources".

Company Profile

5.13.11

Rotter; Lawrence D. - Pleasanton CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical Metrology Tool Equipped With Modulated Illumination Sources App 20210223166 - Shchegrov; Andrei V. ; et al.	2021-07-22
Optical metrology tool equipped with modulated illumination sources Grant 10,969,328 - Shchegrov , et al. April 6, 2	2021-04-06
Optical Metrology Tool Equipped with Modulated Illumination Sources App 20190195782 - Shchegrov; Andrei V. ; et al.	2019-06-27
Optical metrology tool equipped with modulated illumination sources Grant 10,215,688 - Shchegrov , et al. Feb	2019-02-26
Systems for providing illumination in optical metrology Grant 10,203,247 - Brady , et al. Feb	2019-02-12
Systems for Providing Illumination in Optical Metrology App 20170146399 - Brady; Gregory R. ; et al.	2017-05-25
Optical Metrology Tool Equipped with Modulated Illumination Sources App 20170016815 - Shchegrov; Andrei V. ; et al.	2017-01-19
Systems for providing illumination in optical metrology Grant 9,512,985 - Brady , et al. December 6, 2	2016-12-06
Optical metrology tool equipped with modulated illumination sources Grant 9,400,246 - Shchegrov , et al. July 26, 2	2016-07-26
Light source tracking in optical metrology system Grant 9,146,156 - Zhuang , et al. September 29, 2	2015-09-29
Discrete polarization scatterometry Grant 8,896,832 - Hill , et al. November 25, 2	2014-11-25
Systems for Providing Illumination in Optical Metrology App 20140240951 - Brady; Gregory R. ; et al.	2014-08-28
Angle-resolved spectroscopic instrument Grant 8,643,841 - Rotter , et al. February 4, 2	2014-02-04
Optical Metrology Tool Equipped with Modulated Illumination Sources App 20130169966 - Shchegrov; Andrei V. ; et al.	2013-07-04
Light Source Tracking In Optical Metrology System App 20130033704 - Zhuang; Guorong V. ; et al.	2013-02-07
System and method for performing photothermal measurements and relaxation compensation Grant 8,111,399 - Rotter , et al. February 7, 2	2012-02-07
Discrete Polarization Scatterometry App 20110310388 - Hill; Andrew V. ; et al.	2011-12-22
System And Method For Performing Photothermal Measurements And Relaxation Compensation App 20100328670 - Rotter; Lawrence D. ; et al.	2010-12-30
Diffractive optical elements and grid polarizers in focusing spectroscopic ellipsometers Grant 6,784,991 - Rotter , et al. August 31, 2	2004-08-31
Diffractive optical elements and grid polarizers in focusing spectroscopic ellipsometers App 20020191185 - Rotter, Lawrence D. ; et al.	2002-12-19

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.