Rotter; Lawrence

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rotter; Lawrence.The latest application filed is for "broadband and wide field angle compensator".

Company Profile

0.7.8

Rotter; Lawrence - Pleasanton CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Broadband and wide field angle compensator Grant 9,857,292 - Rotter , et al. January 2, 2	2018-01-02
Broadband And Wide Field Angle Compensator App 20170052112 - Rotter; Lawrence ; et al.	2017-02-23
Broadband and wide field angle compensator Grant 9,519,093 - Rotter , et al. December 13, 2	2016-12-13
Multiple angles of incidence semiconductor metrology systems and methods Grant 9,310,290 - Wang , et al. April 12, 2	2016-04-12
Multiple Angles Of Incidence Semiconductor Metrology Systems And Methods App 20150285735 - Wang; David Y. ; et al.	2015-10-08
Multiple angles of incidence semiconductor metrology systems and methods Grant 9,116,103 - Wang , et al. August 25, 2	2015-08-25
Broadband And Wide Field Angle Compensator App 20150055123 - Rotter; Lawrence ; et al.	2015-02-26
Multiple Angles Of Incidence Semiconductor Metrology Systems And Methods App 20140375981 - Wang; David Y. ; et al.	2014-12-25
Calibration Of An Optical Metrology System For Critical Dimension Application Matching App 20130245985 - Flock; Klaus ; et al.	2013-09-19
Measurement system with separate optimized beam paths Grant 7,227,637 - Wang , et al. June 5, 2	2007-06-05
Flat spectrum illumination source for optical metrology Grant 7,154,607 - Hendrix , et al. December 26, 2	2006-12-26
Measurement system with separate optimized beam paths App 20060180761 - Wang; David Y. ; et al.	2006-08-17
Measurement system with separate optimized beam paths Grant 7,061,614 - Wang , et al. June 13, 2	2006-06-13
Flat spectrum illumination source for optical metrology App 20040150828 - Hendrix, James Lee ; et al.	2004-08-05
Measurement system with separate optimized beam paths App 20030071996 - Wang, David Y. ; et al.	2003-04-17

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