Rosenweig; Moshe

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rosenweig; Moshe.The latest application filed is for "system and method for design based inspection".

Company Profile

0.6.6

Rosenweig; Moshe - Rehovot IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of deep learning-based examination of a semiconductor specimen and system thereof Grant 11,348,001 - Karlinsky , et al. May 31, 2	2022-05-31
Method of deep learning-based examination of a semiconductor specimen and system thereof Grant 11,205,119 - Karlinsky , et al. December 21, 2	2021-12-21
Method of deep learning-based examination of a semiconductor specimen and system thereof Grant 11,010,665 - Karlinsky , et al. May 18, 2	2021-05-18
System and method for design based inspection Grant 10,229,241 - Parizat , et al.	2019-03-12
System And Method For Design Based Inspection App 20180357357 - Parizat; Ziv ; et al.	2018-12-13
System and method for design based inspection Grant 10,055,534 - Parizat , et al. August 21, 2	2018-08-21
System and method for patch based inspection Grant 9,904,995 - Karlinsky , et al. February 27, 2	2018-02-27
Method Of Deep Learning-based Examination Of A Semiconductor Specimen And System Thereof App 20170364798 - KARLINSKY; Leonid ; et al.	2017-12-21
Method Of Deep Learining-based Examination Of A Semiconductor Specimen And System Thereof App 20170357895 - KARLINSKY; Leonid ; et al.	2017-12-14
System And Method For Design Based Inspection App 20170270232 - PARIZAT; Ziv ; et al.	2017-09-21
Method Of Deep Learining-based Examination Of A Semiconductor Specimen And System Thereof App 20170177997 - KARLINSKY; Leonid ; et al.	2017-06-22
System And Method For Patch Based Inspection App 20170169554 - KARLINSKY; Leonid ; et al.	2017-06-15

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