Rosengaus; Eliezer
Patent Applications and Registrations
Patent applications and USPTO patent grants for Rosengaus; Eliezer.The latest application filed is for "systems and methods for region-adaptive defect detection".
Company Profile
2.40.10
- Rosengaus; Eliezer - Seattle WA
- Rosengaus; Eliezer - Palo Alto CA
Patent Activity
| Patent | Date |
|---|---|
| Aligning and blending image data from multiple image sensors Grant 11,265,481 - Rosengaus , et al. March 1, 2 | 2022-03-01 |
| Systems and methods for inspection of a specimen Grant 11,204,330 - Vaez-Iravani , et al. December 21, 2 | 2021-12-21 |
| Generating motion extracted images Grant 10,999,506 - Sorgi , et al. May 4, 2 | 2021-05-04 |
| High dynamic range imaging for event detection and inventory management Grant 10,863,105 - Rosengaus , et al. December 8, 2 | 2020-12-08 |
| Systems and methods for region-adaptive defect detection Grant 10,535,131 - Maher , et al. Ja | 2020-01-14 |
| Motion extracted high dynamic range images Grant 10,498,963 - Sorgi , et al. De | 2019-12-03 |
| Systems and Methods for Region-Adaptive Defect Detection App 20170140516 - Maher; Christopher ; et al. | 2017-05-18 |
| Acquisition of information for a construction site Grant 9,222,771 - Rosengaus , et al. December 29, 2 | 2015-12-29 |
| Systems and methods for inspection of a specimen Grant 9,068,917 - Vaez-Iravani , et al. June 30, 2 | 2015-06-30 |
| Digital pathology system Grant 9,041,930 - Young , et al. May 26, 2 | 2015-05-26 |
| Status polling Grant 8,645,100 - Bhaskar , et al. February 4, 2 | 2014-02-04 |
| Method and system for hierarchical tissue analysis and classification Grant 8,600,143 - Kulkarni , et al. December 3, 2 | 2013-12-03 |
| Acquisition of Information for a Construction Site App 20130096873 - Rosengaus; Eliezer ; et al. | 2013-04-18 |
| Systems and methods for creating persistent data for a wafer and for using persistent data for inspection-related functions Grant 8,126,255 - Bhaskar , et al. February 28, 2 | 2012-02-28 |
| Memory load balancing Grant 7,865,037 - Bhaskar , et al. January 4, 2 | 2011-01-04 |
| Oblique incidence macro wafer inspection Grant 7,724,362 - Rosengaus May 25, 2 | 2010-05-25 |
| Multi-spectral techniques for defocus detection Grant 7,719,677 - Rosengaus May 18, 2 | 2010-05-18 |
| Mirror node process verification Grant 7,602,958 - Bhaskar , et al. October 13, 2 | 2009-10-13 |
| Daisy chained topology Grant 7,555,409 - Bhaskar , et al. June 30, 2 | 2009-06-30 |
| Systems And Methods For Creating Persistent Data For A Wafer And For Using Persistent Data For Inspection-related Functions App 20090080759 - Bhaskar; Kris ; et al. | 2009-03-26 |
| Multi-spectral techniques for defocus detection App 20080212089 - Rosengaus; Eliezer | 2008-09-04 |
| Wafer inspection systems and methods for analyzing inspection data Grant 7,417,724 - Sullivan , et al. August 26, 2 | 2008-08-26 |
| Surface scanning Grant 7,397,553 - Mehanian , et al. July 8, 2 | 2008-07-08 |
| Programmable image computer Grant 7,379,838 - Bhaskar , et al. May 27, 2 | 2008-05-27 |
| Edge bead removal inspection by reflectometry Grant 7,324,198 - Rosengaus January 29, 2 | 2008-01-29 |
| Wafer edge inspection apparatus Grant 7,280,197 - Rosengaus October 9, 2 | 2007-10-09 |
| Full swath analysis Grant 7,251,586 - Bhaskar , et al. July 31, 2 | 2007-07-31 |
| Wafer inspection systems and methods for analyzing inspection data Grant 7,227,628 - Sullivan , et al. June 5, 2 | 2007-06-05 |
| Status Polling App 20070124095 - Bhaskar; Krishnamurthy ; et al. | 2007-05-31 |
| Status polling Grant 7,181,368 - Bhaskar , et al. February 20, 2 | 2007-02-20 |
| Resolution enhancement for macro wafer inspection Grant 7,176,433 - Rosengaus February 13, 2 | 2007-02-13 |
| Programmable Image Computer App 20070005284 - Bhaskar; Krishnamurthy ; et al. | 2007-01-04 |
| Programmable image computer Grant 7,149,642 - Bhaskar , et al. December 12, 2 | 2006-12-12 |
| Edge bead removal inspection by reflectometry Grant 7,142,300 - Rosengaus November 28, 2 | 2006-11-28 |
| Multi-spectral techniques for defocus detection App 20060164649 - Rosengaus; Eliezer | 2006-07-27 |
| Memory load balancing Grant 7,076,390 - Bhaskar , et al. July 11, 2 | 2006-07-11 |
| Systems and methods for inspection of specimen surfaces Grant 7,072,034 - Rosengaus , et al. July 4, 2 | 2006-07-04 |
| Full swath analysis App 20060106580 - Bhaskar; Krishnamurthy ; et al. | 2006-05-18 |
| Full swath analysis Grant 7,024,339 - Bhaskar , et al. April 4, 2 | 2006-04-04 |
| Edge bead removal inspection by reflectometry App 20040223141 - Rosengaus, Eliezer | 2004-11-11 |
| Illumination delivery system Grant 6,796,697 - Bragg , et al. September 28, 2 | 2004-09-28 |
| System and method for inspecting semiconductor wafers Grant 6,791,680 - Rosengaus , et al. September 14, 2 | 2004-09-14 |
| Systems and methods for inspection of specimen surfaces App 20020186368 - Rosengaus, Eliezer ; et al. | 2002-12-12 |
| System and method for inspecting semiconductor wafers Grant 6,020,957 - Rosengaus , et al. February 1, 2 | 2000-02-01 |
| Method and apparatus for remotely measuring the temperature of a surface Grant 5,653,539 - Rosengaus August 5, 1 | 1997-08-05 |
| Emission microscopy system Grant 4,755,874 - Esrig , et al. July 5, 1 | 1988-07-05 |
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