Rosencwaig; Allan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rosencwaig; Allan.The latest application filed is for "modulated reflectance measurement system using uv probe".

Company Profile

0.57.26

Rosencwaig; Allan - Danville CA US
Rosencwaig; Allan - Daville CA
Rosencwaig; Allan - Summit NJ
Rosencwaig; Allan - Piscataway NJ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Modulated reflectance measurement system using UV probe Grant 8,817,260 - Opsal , et al. August 26, 2	2014-08-26
Modulated Reflectance Measurement System Using Uv Probe App 20100134785 - Opsal; Jon ; et al.	2010-06-03
Modulated reflectance measurement system using UV probe Grant 7,646,486 - Opsal , et al. January 12, 2	2010-01-12
Digital Picture Frame Device And System App 20090316056 - Rosencwaig; Allan ; et al.	2009-12-24
Modulated Reflectance Measurement System Using Uv Probe App 20080158565 - Opsal; Jon ; et al.	2008-07-03
Digital Picture Frame Device And System App 20080143890 - Rosencwaig; Allan ; et al.	2008-06-19
Modulated reflectance measurement system using UV probe Grant 7,362,441 - Opsal , et al. April 22, 2	2008-04-22
Beam profile complex reflectance system and method for thin film and critical dimension measurements Grant 7,286,243 - Rosencwaig October 23, 2	2007-10-23
High-sensitivity surface detection system and method App 20070229833 - Rosencwaig; Allan ; et al.	2007-10-04
Critical dimension analysis with simultaneous multiple angle of incidence measurements Grant 7,248,375 - Opsal , et al. July 24, 2	2007-07-24
Modulated reflectance measurement system using UV probe App 20070008541 - Opsal; Jon ; et al.	2007-01-11
Modulated reflectance measurement system using UV probe Grant 7,126,690 - Opsal , et al. October 24, 2	2006-10-24
Optical inspection equipment for semiconductor wafers with precleaning Grant 7,068,370 - Rosencwaig , et al. June 27, 2	2006-06-27
Optical scatterometry of asymmetric lines and structures Grant 7,061,627 - Opsal , et al. June 13, 2	2006-06-13
Critical dimension analysis with simultaneous multiple angle of incidence measurements App 20060012803 - Opsal; Jon ; et al.	2006-01-19
Critical dimension analysis with simultaneous multiple angle of incidence measurements Grant 6,972,852 - Opsal , et al. December 6, 2	2005-12-06
Beam profile complex reflectance system and method for thin film and critical dimension measurements App 20050248773 - Rosencwaig, Allan	2005-11-10
Optical inspection equipment for semiconductor wafers with precleaning App 20050231719 - Rosencwaig, Allan ; et al.	2005-10-20
Optical inspection equipment for semiconductor wafers with precleaning Grant 6,930,771 - Rosencwaig , et al. August 16, 2	2005-08-16
Thin film optical measurement system and method with calibrating ellipsometer Grant 6,922,244 - Rosencwaig , et al. July 26, 2	2005-07-26
Monitoring temperature and sample characteristics using a rotating compensator ellipsometer Grant 6,894,781 - Wei , et al. May 17, 2	2005-05-17
Critical dimension analysis with simultaneous multiple angle of incidence measurements App 20050057760 - Opsal, Jon ; et al.	2005-03-17
Optical scatterometry of asymmetric lines and structures App 20050041258 - Opsal, Jon ; et al.	2005-02-24
Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements Grant 6,842,259 - Rosencwaig , et al. January 11, 2	2005-01-11
Critical dimension analysis with simultaneous multiple angle of incidence measurements Grant 6,829,057 - Opsal , et al. December 7, 2	2004-12-07
Thin film optical measurement system and method with calibrating ellipsometer App 20040218180 - Rosencwaig, Allan ; et al.	2004-11-04
Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements Grant 6,813,034 - Rosencwaig , et al. November 2, 2	2004-11-02
Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements App 20040212810 - Rosencwaig, Allan ; et al.	2004-10-28
Method of monitoring the fabrication of thin film layers forming a DWDM filter Grant 6,781,692 - Rosencwaig August 24, 2	2004-08-24
Apparatus for analyzing multi-layer thin film stacks on semiconductors Grant 6,774,997 - Rosencwaig , et al. August 10, 2	2004-08-10
High-temperature superconductivity devices and methods App 20040152599 - Rosencwaig, Allan	2004-08-05
Measurement of thin films and barrier layers on patterned wafers with X-ray reflectometry Grant 6,754,305 - Rosencwaig , et al. June 22, 2	2004-06-22
Modulated reflectance measurement system using UV probe App 20040104352 - Opsal, Jon ; et al.	2004-06-03
Optical inspection equipment for semiconductor wafers with precleaning App 20040100633 - Rosencwaig, Allan ; et al.	2004-05-27
Optical inspection equipment for semiconductor wafers with precleaning Grant 6,714,300 - Rosencwaig , et al. March 30, 2	2004-03-30
Critical dimension analysis with simultaneous multiple angle of incidence measurements App 20040046968 - Opsal, Jon ; et al.	2004-03-11
Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements Grant 6,678,349 - Opsal , et al. January 13, 2	2004-01-13
Critical dimension analysis with simultaneous multiple angle of incidence measurements Grant 6,654,131 - Opsal , et al. November 25, 2	2003-11-25
Monitoring temperature and sample characteristics using a rotating compensator ellipsometer App 20030197864 - Wei, Lanhua ; et al.	2003-10-23
Apparatus for analyzing multi-layer thin film stacks on semiconductors App 20030160959 - Rosencwaig, Allan ; et al.	2003-08-28
Combination thin-film stress and thickness measurement device Grant 6,608,689 - Wei , et al. August 19, 2	2003-08-19
Analysis of isolated and aperiodic structures with simultaneous multiple angle of incidence measurements App 20030147086 - Rosencwaig, Allan ; et al.	2003-08-07
Monitoring temperature and sample characteristics using a rotating compensator ellipsometer Grant 6,583,875 - Wei , et al. June 24, 2	2003-06-24
Apparatus for analyzing multi-layer thin film stacks on semiconductors Grant 6,567,213 - Rosencwaig , et al. May 20, 2	2003-05-20
Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements App 20030081725 - Opsal, Jon ; et al.	2003-05-01
Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements Grant 6,512,815 - Opsal , et al. January 28, 2	2003-01-28
Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements App 20020154736 - Opsal, Jon ; et al.	2002-10-24
Apparatus for analyzing multi-layer thin film stacks on semiconductors App 20020154302 - Rosencwaig, Allan ; et al.	2002-10-24
Critical dimension analysis with simultaneous multiple angle of incidence measurements App 20020135783 - Opsal, Jon ; et al.	2002-09-26
Critical dimension analysis with simultaneous multiple angle of incidence measurements Grant 6,429,943 - Opsal , et al. August 6, 2	2002-08-06
Apparatus for analyzing samples using combined thermal wave and X-ray reflectance measurements Grant 6,408,048 - Opsal , et al. June 18, 2	2002-06-18
Apparatus for analyzing samples using combined thermal wave and x-ray reflectance measurements App 20020001364 - Opsal, Jon ; et al.	2002-01-03
Apparatus for analyzing multi-layer thin film stacks on semiconductors App 20010033378 - Rosencwaig, Allan ; et al.	2001-10-25
Apparatus for analyzing multi-layer thin film stacks on semiconductors Grant 6,297,880 - Rosencwaig , et al. October 2, 2	2001-10-02
Apparatus for analyzing multi-layer thin film stacks on semiconductors Grant 6,278,519 - Rosencwaig , et al. August 21, 2	2001-08-21
Apparatus for non-invasive analyses of biological compounds Grant 5,657,754 - Rosencwaig August 19, 1	1997-08-19
Sample characteristic analysis utilizing multi wavelength and multi angle polarization and magnitude change detection Grant 5,596,406 - Rosencwaig , et al. January 21, 1	1997-01-21
Multiple angle spectroscopic analyzer utilizing interferometric and ellipsometric devices Grant 5,412,473 - Rosencwaig , et al. May 2, 1	1995-05-02
Apparatus for evaluating thermal and electrical characteristics in a sample Grant 5,228,776 - Smith , et al. July 20, 1	1993-07-20
Method and apparatus for evaluating the thickness of thin films Grant 5,181,080 - Fanton , et al. January 19, 1	1993-01-19
Optical measurement device with enhanced sensitivity Grant 5,159,412 - Willenborg , et al. October 27, 1	1992-10-27
Apparatus for measuring grain sizes in metalized layers Grant 5,149,978 - Opsal , et al. September 22, 1	1992-09-22
Method and apparatus for evaluating surface and subsurface and subsurface features in a semiconductor Grant 5,042,952 - Opsal , et al. * August 27, 1	1991-08-27
High resolution ellipsometric apparatus Grant 5,042,951 - Gold , et al. August 27, 1	1991-08-27
Method and apparatus for measuring thickness of thin films Grant 4,999,014 - Gold , et al. March 12, 1	1991-03-12
Method and apparatus for evaluating surface and subsurface features in a semiconductor Grant 4,952,063 - Opsal , et al. * August 28, 1	1990-08-28
Method and apparatus for evaluating surface and subsurface features in a semiconductor Grant 4,854,710 - Opsal , et al. August 8, 1	1989-08-08
Apparatus for locating and testing areas of interest on a workpiece Grant 4,795,260 - Schuur , et al. January 3, 1	1989-01-03
Method and apparatus for optically detecting surface states in materials Grant 4,750,822 - Rosencwaig , et al. June 14, 1	1988-06-14
Evaluating both thickness and compositional variables in a thin film sample Grant 4,679,946 - Rosencwaig , et al. * July 14, 1	1987-07-14
Method and apparatus for evaluating surface conditions of a sample Grant 4,636,088 - Rosencwaig , et al. * January 13, 1	1987-01-13
Method and apparatus for detecting thermal waves Grant 4,634,290 - Rosencwaig , et al. * January 6, 1	1987-01-06
Evaluation of surface and subsurface characteristics of a sample Grant 4,632,561 - Rosencwaig , et al. December 30, 1	1986-12-30
Detecting thermal waves to evaluate thermal parameters Grant 4,579,463 - Rosencwaig , et al. April 1, 1	1986-04-01
Thin film thickness measurement with thermal waves Grant 4,522,510 - Rosencwaig , et al. June 11, 1	1985-06-11
Method for detection of thermal waves with a laser probe Grant 4,521,118 - Rosencwaig June 4, 1	1985-06-04
Thin film thickness measurements and depth profiling utilizing a thermal wave detection system Grant 4,513,384 - Rosencwaig April 23, 1	1985-04-23
Method for evaluating the quality of the bond between two members utilizing thermoacoustic microscopy Grant 4,484,820 - Rosencwaig November 27, 1	1984-11-27
Method for introduction of gases into microspheres Grant 4,257,798 - Hendricks , et al. March 24, 1	1981-03-24
Thermoacoustic microscopy Grant 4,255,971 - Rosencwaig March 17, 1	1981-03-17
Photo acoustic cell Grant 4,028,932 - Rosencwaig June 14, 1	1977-06-14
Methods and means for analyzing substances Grant 3,948,345 - Rosencwaig April 6, 1	1976-04-06

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