Rosakis; Ares J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rosakis; Ares J..The latest application filed is for "characterizing curvatures and stresses in thin-film structures on substrates having spatially non-uniform variations".

Company Profile

0.13.9

Rosakis; Ares J. - Altadena CA
Rosakis; Ares J. - Atadena CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Surface characterization based on optical phase shifting interferometry Grant 7,990,543 - Mello , et al. August 2, 2	2011-08-02
Characterizing curvatures and stresses in thin-film structures on substrates having spatially non-uniform variations Grant 7,966,135 - Rosakis , et al. June 21, 2	2011-06-21
Measuring stresses in multi-layer thin film systems with variable film thickness Grant 7,930,113 - Huang , et al. April 19, 2	2011-04-19
Surface characterization based on lateral shearing of diffracted wave fronts to measure in-plane and out-of-plane displacement gradient fields Grant 7,538,891 - Mello , et al. May 26, 2	2009-05-26
Techniques and devices for characterizing spatially non-uniform curvatures and stresses in thin-film structures on substrates with non-local effects Grant 7,487,050 - Rosakis , et al. February 3, 2	2009-02-03
Full-field optical measurements of surface properties of panels, substrates and wafers Grant 7,369,251 - Rosakis , et al. May 6, 2	2008-05-06
Techniques for analyzing non-uniform curvatures and stresses in thin-film structures on substrates with non-local effects Grant 7,363,173 - Rosakis , et al. April 22, 2	2008-04-22
Characterizing Curvatures and Stresses in Thin-Film Structures on Substrates having Spatially Non-Uniform Variations App 20070180919 - Rosakis; Ares J. ; et al.	2007-08-09
Techniques and devices for characterizing spatially non-uniform curvatures and stresses in thin-film structures on substrates with non-local effects App 20060276977 - Rosakis; Ares J. ; et al.	2006-12-07
Techniques for analyzing non-uniform curvatures and stresses in thin-film structures on substrates with non-local effects App 20050278126 - Rosakis, Ares J. ; et al.	2005-12-15
Systems for measuring stresses in line features formed on substrates Grant 6,924,497 - Suresh , et al. August 2, 2	2005-08-02
Analysis and monitoring of stresses in embedded lines and vias integrated on substrates App 20050030551 - Rosakis, Ares J. ; et al.	2005-02-10
Optical characterization of surfaces and plates App 20050007601 - Rosakis, Ares J. ; et al.	2005-01-13
Full-field optical measurements of surface properties of panels, substrates and wafers App 20040257587 - Rosakis, Ares J. ; et al.	2004-12-23
Determining large deformations and stresses of layered and graded structures to include effects of body forces Grant 6,781,702 - Giannakopoulos , et al. August 24, 2	2004-08-24
Real-time evaluation of stress fields and properties in line features formed on substrates App 20040075825 - Suresh, Subra ; et al.	2004-04-22
Real-time evaluation of stress fields and properties in line features formed on substrates Grant 6,600,565 - Suresh , et al. July 29, 2	2003-07-29
Determining large deformations and stresses of layered and graded structures to include effects of body forces App 20030106378 - Giannakopoulos, Antonios ; et al.	2003-06-12
Coherent gradient sensing ellipsometer Grant 6,469,788 - Boyd , et al. October 22, 2	2002-10-22
Coherent gradient sensing ellipsometer App 20020012122 - Boyd, David A. ; et al.	2002-01-31
High speed infrared imaging system and method Grant 6,268,883 - Zehnder , et al. July 31, 2	2001-07-31
Coherent gradient sensing method and system for measuring surface curvature Grant 6,031,611 - Rosakis , et al. February 29, 2	2000-02-29

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