| Patent | Date |
|---|
Dynamic Memory With Sustainable Storage Architecture
App 20220246199 - Lu; Chao-Chun ; et al. | 2022-08-04 |
Dynamic Memory With Sustainable Storage Architecture And Clean Up Circuit
App 20220246192 - Lu; Chao-Chun ; et al. | 2022-08-04 |
Dynamic memory with sustainable storage architecture
Grant 11,302,383 - Lu , et al. April 12, 2 | 2022-04-12 |
Sustainable Dram Having Principle Power Supply Voltage Unified With Logic Circuit
App 20210295893 - LU; Chao-Chun ; et al. | 2021-09-23 |
Dynamic Memory With Long Retention Time
App 20210225434 - LU; Chao-Chun ; et al. | 2021-07-22 |
Dynamic Memory With Sustainable Storage Architecture
App 20200185022 - Lu; Chao-Chun ; et al. | 2020-06-11 |
System-in-package module and manufacture method for a system-in-package module
Grant 9,601,456 - Rong , et al. March 21, 2 | 2017-03-21 |
Bundled memory and manufacture method for a bundled memory with an external input/output bus
Grant 9,589,931 - Rong , et al. March 7, 2 | 2017-03-07 |
Memory with variable operation voltage and the adjusting method thereof
Grant 9,465,430 - Shiah , et al. October 11, 2 | 2016-10-11 |
Bundled memory and manufacture method for a bundled memory with an external input/output bus
Grant 9,214,448 - Rong , et al. December 15, 2 | 2015-12-15 |
Bundled Memory And Manufacture Method For A Bundled Memory With An External Input/output Bus
App 20150228620 - Rong; Bor-Doou ; et al. | 2015-08-13 |
System-in-package Module And Manufacture Method For A System-in-package Module
App 20150206849 - Rong; Bor-Doou ; et al. | 2015-07-23 |
Bundled memory and manufacture method for a bundled memory with an external input/output bus
Grant 9,070,558 - Rong , et al. June 30, 2 | 2015-06-30 |
Memory With Variable Operation Voltage And The Adjusting Method Thereof
App 20140351609 - SHIAH; Chun ; et al. | 2014-11-27 |
Bundled Memory And Manufacture Method For A Bundled Memory With An External Input/output Bus
App 20140308809 - Rong; Bor-Doou ; et al. | 2014-10-16 |
Bundled Memory And Manufacture Method For A Bundled Memory With An External Input/output Bus
App 20130248860 - Rong; Bor-Doou ; et al. | 2013-09-26 |
Data detecting apparatus and methods thereof
Grant 7,983,102 - Wang , et al. July 19, 2 | 2011-07-19 |
Data Detecting Apparatus And Methods Thereof
App 20100103753 - WANG; Shih-Hsing ; et al. | 2010-04-29 |
Dynamic input setup/hold time improvement architecture
Grant 7,515,669 - Shiah , et al. April 7, 2 | 2009-04-07 |
Time controllable sensing scheme for sense amplifier in memory IC test
Grant 7,478,294 - Rong , et al. January 13, 2 | 2009-01-13 |
Calibrated built-in temperature sensor and calibration method thereof
Grant 7,434,985 - Hsu , et al. October 14, 2 | 2008-10-14 |
Re-routing method and the circuit thereof
App 20080202800 - Kuo; Ming-Hong ; et al. | 2008-08-28 |
Internal power management scheme for a memory chip in deep power down mode
Grant 7,292,494 - Hsu , et al. November 6, 2 | 2007-11-06 |
Calibrated built-in temperature sensor and calibration method thereof
App 20070140308 - Hsu; Jen-Shou ; et al. | 2007-06-21 |
Dynamic input setup/hold time improvement architecture
App 20070058765 - Shiah; Chun ; et al. | 2007-03-15 |
Time controllable sensing scheme for sense amplifier in memory IC test
App 20070011508 - Rong; Bor-Doou ; et al. | 2007-01-11 |
Re-routing method and the circuit thereof
App 20060284635 - Kuo; Ming-Hong ; et al. | 2006-12-21 |
Low power design for fuse control circuit
Grant 7,098,722 - Shih , et al. August 29, 2 | 2006-08-29 |
Internal power management scheme for a memory chip in deep power down mode
App 20060146636 - Hsu; Jen-Shou ; et al. | 2006-07-06 |
Internal power management scheme for a memory chip in deep power down mode
Grant 7,031,219 - Hsu , et al. April 18, 2 | 2006-04-18 |
Test pads for IC chip
App 20060028228 - Rong; Bor-Doou | 2006-02-09 |
Low power design for fuse control circuit
App 20060012418 - Shih; Jeng-Tzong ; et al. | 2006-01-19 |
Internal power management scheme for a memory chip in deep power down mode
App 20050270880 - Hsu, Jen-Shoe ; et al. | 2005-12-08 |
Variable self-time scheme for write recovery by low speed tester
Grant 6,934,899 - Yuan , et al. August 23, 2 | 2005-08-23 |
Wafer level burn-in for memory integrated circuit
Grant 6,661,719 - Shih , et al. December 9, 2 | 2003-12-09 |
Low power SRAM redundancy repair scheme
Grant 6,643,166 - Ting , et al. November 4, 2 | 2003-11-04 |
Variable self-time scheme for write recovery by low speed tester
App 20030145260 - Yuan, Der-Min ; et al. | 2003-07-31 |
Area efficient global row redundancy scheme for DRAM
Grant 6,101,138 - Shiah , et al. August 8, 2 | 2000-08-08 |
Level boost restoration circuit
Grant 5,723,994 - Ting , et al. March 3, 1 | 1998-03-03 |
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