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Patent applications and USPTO patent grants for Rokkaku; Tadashi.The latest application filed is for "vertical probe and jig for vertical probe".
Patent | Date |
---|---|
Vertical probe and jig for vertical probe Grant 10,996,243 - Iwana , et al. May 4, 2 | 2021-05-04 |
Vertical Probe And Jig For Vertical Probe App 20200182908 - IWANA; Akiko ;   et al. | 2020-06-11 |
Method For Manufacturing Inspection Probe App 20130313234 - Rokkaku; Tadashi ;   et al. | 2013-11-28 |
Potential sensor for detecting voltage of inspection target at non-contact condition to attain higher speed of inspection Grant 6,667,632 - Murakawa , et al. December 23, 2 | 2003-12-23 |
Potential sensor for detecting voltage of inspection target at non-contact condition to attain higher speed of inspection App 20020153919 - Murakawa, Shinichi ;   et al. | 2002-10-24 |
DC or HF ion source Grant 5,369,337 - Yanagi , et al. November 29, 1 | 1994-11-29 |
Sputtering apparatus and an ion source Grant 5,288,386 - Yanagi , et al. February 22, 1 | 1994-02-22 |
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