Rohner; Michael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rohner; Michael.The latest application filed is for "circuit and method for internally assessing dielectric reliability of a semiconductor technology".

Company Profile

0.5.5

Rohner; Michael - Munich DE
Rohner; Michael - Munchen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Circuit and method for internally assessing dielectric reliability of a semiconductor technology Grant 10,242,922 - Rohner , et al.	2019-03-26
Circuit and Method for Internally Assessing Dielectric Reliability of a Semiconductor Technology App 20150194358 - Rohner; Michael ; et al.	2015-07-09
Method for fabricating a semiconductor memory device Grant 6,858,492 - Bruchhaus , et al. February 22, 2	2005-02-22
Method for fabricating a semiconductor memory device Grant 6,818,503 - Bruchhaus , et al. November 16, 2	2004-11-16
Method for fabricating a semiconductor memory device Grant 6,773,986 - Bruchhaus , et al. August 10, 2	2004-08-10
FeRAM memory and method for manufacturing it Grant 6,704,219 - Bruchhaus , et al. March 9, 2	2004-03-09
Method for fabricating a semiconductor memory device App 20030129796 - Bruchhaus, Rainer ; et al.	2003-07-10
Method for fabricating a semiconductor memory device App 20030058700 - Bruchhaus, Rainer ; et al.	2003-03-27
Method for fabricating a semiconductor memory device App 20030060002 - Bruchhaus, Rainer ; et al.	2003-03-27
FeRAM memory and method for manufacturing it App 20030053346 - Bruchhaus, Rainer ; et al.	2003-03-20

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