loadpatents
name:-0.0082809925079346
name:-0.017132043838501
name:-0.0004432201385498
Roessler; Kenneth G. Patent Filings

Roessler; Kenneth G.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Roessler; Kenneth G..The latest application filed is for "apparatus and method for contamination identification".

Company Profile
0.15.7
  • Roessler; Kenneth G. - Boca Raton FL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Apparatus and method for contamination identification
Grant 11,311,917 - LeClaire , et al. April 26, 2
2022-04-26
Apparatus And Method For Contamination Identification
App 20170189945 - LeClaire; Jeffrey E. ;   et al.
2017-07-06
Apparatus and method for indirect surface cleaning
Grant 9,588,420 - LeClaire , et al. March 7, 2
2017-03-07
Apparatus And Method For Indirect Surface Cleaning
App 20160170297 - LECLAIRE; JEFFREY E. ;   et al.
2016-06-16
Apparatus and method for indirect surface cleaning
Grant 9,285,674 - LeClaire , et al. March 15, 2
2016-03-15
Apparatus And Method For Indirect Surface Cleaning
App 20150185602 - LeClaire; Jeffrey E. ;   et al.
2015-07-02
Apparatus and method for indirect surface cleaning
Grant 8,986,460 - LeClaire , et al. March 24, 2
2015-03-24
Apparatus and Method For Indirect Surface Cleaning
App 20140283873 - LeClaire; Jeffrey E. ;   et al.
2014-09-25
Apparatus and method for indirect surface cleaning
Grant 8,741,067 - LeClaire , et al. June 3, 2
2014-06-03
Apparatus And Method For Indirect Surface Cleaning
App 20140069457 - LeClaire; Jeffrey E. ;   et al.
2014-03-13
Apparatus and method for indirect surface cleaning
Grant 8,613,803 - LeClaire , et al. December 24, 2
2013-12-24
Apparatus And Method For Indirect Surface Cleaning
App 20130276818 - LeClaire; Jeffrey E. ;   et al.
2013-10-24
Wafer fabrication process
Grant 8,562,749 - LeClaire , et al. October 22, 2
2013-10-22
Apparatus and method for indirect surface cleaning
Grant 8,293,019 - LeClaire , et al. October 23, 2
2012-10-23
Wafer Fabrication Process
App 20120231397 - Le Claire; Jeffrey E. ;   et al.
2012-09-13
Apparatus and method for direct surface cleaning
Grant 8,182,609 - Le Claire , et al. May 22, 2
2012-05-22
Method for improving measurement accuracy using active lateral scanning control of a probe
Grant 5,773,824 - Flecha , et al. June 30, 1
1998-06-30
Method and system for controlling high-speed probe actuators
Grant 5,635,848 - Hammond , et al. June 3, 1
1997-06-03
Dual quad flexure scanner
Grant 5,360,974 - Hammond , et al. November 1, 1
1994-11-01
Automatic tip approach method and apparatus for scanning probe microscope
Grant 5,262,643 - Hammond , et al. November 16, 1
1993-11-16
Sample carriage for scanning probe microscope
Grant 5,260,577 - Abraham , et al. November 9, 1
1993-11-09

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