Roessiger; Martin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Roessiger; Martin.The latest application filed is for "method for assessing the usability of an exposed and developed semiconductor wafer".

Company Profile

1.4.12

Roessiger; Martin - Erlangen DE
Roessiger; Martin - Dresden DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for processing of a further layer on a semiconductor wafer Grant 10,699,971 - Habets , et al.	2020-06-30
Method For Assessing The Usability Of An Exposed And Developed Semiconductor Wafer App 20180342429 - Habets; Boris ; et al.	2018-11-29
Method for assessing the usability of an exposed and developed semiconductor wafer Grant 10,008,422 - Habets , et al. June 26, 2	2018-06-26
Method And Apparatus For Analysis Of Processing Of A Semiconductor Wafer App 20170053842 - Roessiger; Martin ; et al.	2017-02-23
Monitoring A First System Of A Technical Plant For Producing A Product App 20150241873 - Goldenberg; Norbert ; et al.	2015-08-27
Cleaning Device And Method For Removing A Lubricant From The Rolls Of A Roll Stand App 20150020845 - Dagner; Johannes ; et al.	2015-01-22
Method For Operating A Continuous Annealing Line For The Processing Of A Rolled Good App 20140175713 - Roessiger; Martin ; et al.	2014-06-26
Semiconductor device, method for manufacturing semiconductor devices and mask systems used in the manufacturing of semiconductor devices Grant 8,018,070 - Blawid , et al. September 13, 2	2011-09-13
Interconnection Structure and Integrated Circuit App 20080296778 - Roessiger; Martin ; et al.	2008-12-04
Semiconductor Device, Method for Manufacturing Semiconductor Devices and Mask Systems Used in the Manufacturing of Semiconductor Devices App 20080261395 - Blawid; Stefan ; et al.	2008-10-23
Method of forming a memory cell array App 20070264760 - Roessiger; Martin	2007-11-15
Hard Mask Layer Stack And A Method Of Patterning App 20070243707 - Manger; Dirk ; et al.	2007-10-18
Device and a method and mask for forming a device App 20070218627 - Lattard; Ludovic ; et al.	2007-09-20
Method for determining statistical fluctuations of values of geometrical properties of structures required for the fabrication of semiconductor components Grant 7,177,788 - Roessiger February 13, 2	2007-02-13
Method for determining statistical fluctuations of values of geometrical properties of structures required for the fabrication of semiconductor components App 20030074168 - Roessiger, Martin	2003-04-17

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