| Patent | Date |
|---|
Microchip Level Shared Array Repair
App 20210319845 - MEEHAN; Timothy ; et al. | 2021-10-14 |
Built-in self-test for bit-write enabled memory arrays
Grant 10,998,075 - Huott , et al. May 4, 2 | 2021-05-04 |
Sequential error capture during memory test
Grant 10,971,242 - Huott , et al. April 6, 2 | 2021-04-06 |
Sequential Error Capture During Memory Test
App 20210074375 - Huott; William ; et al. | 2021-03-11 |
Built-in Self-test For Bit-write Enabled Memory Arrays
App 20210074376 - Huott; William ; et al. | 2021-03-11 |
Power saving scannable latch output driver
Grant 10,890,623 - Huott , et al. January 12, 2 | 2021-01-12 |
Testing content addressable memory and random access memory
Grant 10,593,420 - Barowski , et al. | 2020-03-17 |
On-chip hardware-controlled window strobing
Grant 10,288,684 - Gentner , et al. | 2019-05-14 |
On-chip hardware-controlled window strobing
Grant 10,281,527 - Gentner , et al. | 2019-05-07 |
Testing content addressable memory and random access memory
Grant 10,170,199 - Barowski , et al. J | 2019-01-01 |
On-chip Hardware-controlled Window Strobing
App 20180364309 - Gentner; Thomas ; et al. | 2018-12-20 |
On-chip Hardware-controlled Window Strobing
App 20180364308 - Gentner; Thomas ; et al. | 2018-12-20 |
Testing content addressable memory and random access memory
Grant 10,079,070 - Barowski , et al. September 18, 2 | 2018-09-18 |
Testing Content Addressable Memory And Random Access Memory
App 20180174666 - Barowski; Harry ; et al. | 2018-06-21 |
Testing Content Addressable Memory And Random Access Memory
App 20180151248 - Barowski; Harry ; et al. | 2018-05-31 |
Partition-able storage of test results using inactive storage elements
Grant 9,983,261 - Huott , et al. May 29, 2 | 2018-05-29 |
Testing Content Addressable Memory And Random Access Memory
App 20180114585 - Barowski; Harry ; et al. | 2018-04-26 |
Partition-able Storage Of Test Results Using Inactive Storage Elements
App 20170350940 - Huott; William V. ; et al. | 2017-12-07 |
Multi-match error detection in content addressable memory testing
Grant 9,697,910 - Huott , et al. July 4, 2 | 2017-07-04 |
Shift register with opposite shift data and shift clock directions
Grant 9,627,012 - Huott , et al. April 18, 2 | 2017-04-18 |
Memory testing system
Grant 8,327,207 - Duffy , et al. December 4, 2 | 2012-12-04 |
Memory Testing System
App 20110307747 - Duffy; Kevin J. ; et al. | 2011-12-15 |
Testing Memory Arrays And Logic With Abist Circuitry
App 20110296259 - Balakrishnan; Bargav ; et al. | 2011-12-01 |
BIST address generation architecture for multi-port memories
Grant 7,536,613 - Huott , et al. May 19, 2 | 2009-05-19 |
Merged MISR and output register without performance impact for circuits under test
Grant 7,478,297 - Chan , et al. January 13, 2 | 2009-01-13 |
Merged MISR and Output Register Without Performance Impact for Circuits Under Test
App 20080059854 - Chan; Yuen H. ; et al. | 2008-03-06 |
Merged MISR and output register without performance impact for circuits under test
Grant 7,305,602 - Chan , et al. December 4, 2 | 2007-12-04 |
Clock duty cycle based access timer combined with standard stage clocked output register
Grant 7,275,194 - Huott , et al. September 25, 2 | 2007-09-25 |
Array self repair using built-in self test techniques
Grant 7,257,745 - Huott , et al. August 14, 2 | 2007-08-14 |
Merged MISR and output register without performance impact for circuits under test
App 20060195738 - Chan; Yuen H. ; et al. | 2006-08-31 |
Clock duty cycle based access timer combined with standard stage clocked output register
App 20060195740 - Huott; William V. ; et al. | 2006-08-31 |
Array self repair using built-in self test techniques
App 20060174175 - Huott; William V. ; et al. | 2006-08-03 |
BIST address generation architecture for multi-port memories
App 20050268167 - Huott, William Vincent ; et al. | 2005-12-01 |
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