Rockwell; Tyler

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rockwell; Tyler.The latest application filed is for "apparatus and system having extraction assembly for wide angle ion beam".

Company Profile

3.8.7

Rockwell; Tyler - Wakefield MA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus and system having extraction assembly for wide angle ion beam Grant 11,056,319 - Biloiu , et al. July 6, 2	2021-07-06
Apparatus And System Having Extraction Assembly For Wide Angle Ion Beam App 20210035779 - Biloiu; Costel ; et al.	2021-02-04
Substrate Halo Arrangement For Improved Process Uniformity App 20190272983 - Wallace; Jay ; et al.	2019-09-05
Radio frequency extraction system for charge neutralized ion beam Grant 10,224,181 - Biloiu , et al.	2019-03-05
Apparatus and techniques for anisotropic substrate etching Grant 10,193,066 - Gilchrist , et al. Ja	2019-01-29
Apparatus And Techniques For Anisotropic Substrate Etching App 20190006587 - Gilchrist; Glen F. R. ; et al.	2019-01-03
Gas injection system for ion beam device Grant 9,865,433 - Wallace , et al. January 9, 2	2018-01-09
Radio Frequency Extraction System For Charge Neutralized Ion Beam App 20170309453 - Biloiu; Costel ; et al.	2017-10-26
Control of ion angular distribution of ion beams with hidden deflection electrode Grant 9,514,912 - Biloiu , et al. December 6, 2	2016-12-06
Control Of Ion Angular Distribution Of Ion Beams With Hidden Deflection Electrode App 20160071693 - Biloiu; Costel ; et al.	2016-03-10
System and method for plasma control using boundary electrode Grant 8,907,300 - Radovanov , et al. December 9, 2	2014-12-09
System And Method For Plasma Control Using Boundary Electrode App 20140265853 - Radovanov; Svetlana B. ; et al.	2014-09-18
Ion beam measurement system and method Grant 8,698,108 - Dzengeleski , et al. April 15, 2	2014-04-15
Techniques for optical ion beam metrology Grant 7,723,697 - Perel , et al. May 25, 2	2010-05-25
Techniques For Optical Ion Beam Metrology App 20090078883 - Perel; Alexander S. ; et al.	2009-03-26

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