Roche; Gregory A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Roche; Gregory A..The latest application filed is for "gliding arc discharge sterilization of surfaces, objects, and ambient air".

Company Profile

1.11.12

Roche; Gregory A. - Durham NC
Roche; Gregory A. - Cary NC US
Roche; Gregory A. - Fort Collins CO US
Roche; Gregory A. - Sunnyvale CA
Roche; Gregory A. - Santa Clara CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Gliding Arc Discharge Sterilization Of Surfaces, Objects, And Ambient Air App 20220125971 - Tyner; David W. ; et al.	2022-04-28
Atmospheric-pressure plasma processing apparatus and method Grant 11,149,370 - Cornelius , et al. October 19, 2	2021-10-19
Atmospheric-pressure Plasma Processing Method App 20160348292 - Cornelius; Carrie E. ; et al.	2016-12-01
Atmospheric-pressure Plasma Processing Apparatus And Method App 20140076861 - Cornelius; Carrie E. ; et al.	2014-03-20
Sensor array for measuring plasma characteristics in plasma processing environments Grant 8,545,669 - Mahoney , et al. October 1, 2	2013-10-01
Wafer probe for measuring plasma and surface characteristics in plasma processing environments Grant 7,192,505 - Roche , et al. March 20, 2	2007-03-20
Diagnostic plasma sensors for endpoint and end-of-life detection App 20060171848 - Roche; Gregory A. ; et al.	2006-08-03
Diagnostic plasma measurement device having patterned sensors and features App 20050284570 - Doran, Daniel B. ; et al.	2005-12-29
Sensor array for measuring plasma characteristics in plasma processing environments App 20050151544 - Mahoney, Leonard J. ; et al.	2005-07-14
Sensor array for measuring plasma characteristics in plasma processing environments Grant 6,902,646 - Mahoney , et al. June 7, 2	2005-06-07
Wafer probe for measuring plasma and surface characteristics in plasma processing enviroments App 20050039852 - Roche, Gregory A. ; et al.	2005-02-24
Sensor array for measuring plasma characteristics in plasma processing enviroments App 20050034811 - Mahoney, Leonard J. ; et al.	2005-02-17
Wafer probe for measuring plasma and surface characteristics in plasma processing environments App 20050034812 - Roche, Gregory A. ; et al.	2005-02-17
Wafer probe for measuring plasma and surface characteristics in plasma processing environments App 20050011611 - Mahoney, Leonard J. ; et al.	2005-01-20
Wafer probe for measuring plasma and surface characteristics in plasma processing environments Grant 6,830,650 - Roche , et al. December 14, 2	2004-12-14
Wafer probe for measuring plasma and surface characteristics in plasma processing enviroments App 20040007326 - Roche, Gregory A. ; et al.	2004-01-15
Inductively coupled ring-plasma source apparatus for processing gases and materials and method thereof Grant 6,432,260 - Mahoney , et al. August 13, 2	2002-08-13
Method for reduction of plasma charging damage during chemical vapor deposition Grant 5,913,140 - Roche , et al. June 15, 1	1999-06-15
Apparatus for laser-induced chemical vapor deposition Grant 4,782,787 - Roche November 8, 1	1988-11-08
Apparatus and method for laser-induced chemical vapor deposition Grant 4,581,248 - Roche April 8, 1	1986-04-08

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