Roberts; Gordon W.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Roberts; Gordon W..The latest application filed is for "high-speed bandpass serial data link".
- Roberts; Gordon W. - Montreal-West CA
- Roberts; Gordon W. - Montreal CA
| Patent | Date |
|---|---|
| Generation of an analog Gaussian noise signal having predetermined characteristics Grant 8,849,882 - Aouini , et al. September 30, 2 | 2014-09-30 |
| High-speed bandpass serial data link Grant 8,258,892 - Abhari , et al. September 4, 2 | 2012-09-04 |
| High-speed Bandpass Serial Data Link App 20090220240 - ABHARI; Ramesh ; et al. | 2009-09-03 |
| Generation of an Analog Gaussian Noise Signal Having Predetermined Characteristics App 20090121749 - ROBERTS; Gordon W. ; et al. | 2009-05-14 |
| Embedded time domain analyzer for high speed circuits Grant 7,474,974 - Roberts , et al. January 6, 2 | 2009-01-06 |
| Embedded time domain analyzer for high speed circuits App 20080183409 - Roberts; Gordon W. ; et al. | 2008-07-31 |
| System and method for generating a jittered test signal Grant 7,315,574 - Hafed , et al. January 1, 2 | 2008-01-01 |
| System and method for testing integrated circuits Grant 7,242,209 - Roberts , et al. July 10, 2 | 2007-07-10 |
| System and method for generating a jittered test signal App 20050271131 - Hafed, Mohamed M. ; et al. | 2005-12-08 |
| System and method for testing integrated circuits App 20050253617 - Roberts, Gordon W. ; et al. | 2005-11-17 |
| Integrated excitation/extraction system for test and measurement Grant 6,931,579 - Roberts , et al. August 16, 2 | 2005-08-16 |
| Method and device for use in DC parametric tests Grant 6,917,320 - Roberts , et al. July 12, 2 | 2005-07-12 |
| Programmable DC voltage generator Grant 6,914,548 - Roberts , et al. July 5, 2 | 2005-07-05 |
| Timing measurement device using a component-invariant vernier delay line Grant 6,850,051 - Roberts , et al. February 1, 2 | 2005-02-01 |
| Method and device for use in DC parametric tests App 20040246002 - Roberts, Gordon W. ; et al. | 2004-12-09 |
| Method and device for use in DC parametric tests Grant 6,727,834 - Roberts , et al. April 27, 2 | 2004-04-27 |
| Method and device for use in DC parametric tests App 20030206127 - Roberts, Gordon W. ; et al. | 2003-11-06 |
| Timing measurement device using a component-invariant vernier delay line App 20030006750 - Roberts, Gordon W. ; et al. | 2003-01-09 |
| Programmable DC voltage generator App 20030006924 - Roberts, Gordon W. ; et al. | 2003-01-09 |
| Integrated excitation/extraction system for test and measurement App 20020019962 - Roberts, Gordon W. ; et al. | 2002-02-14 |
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