Robertazzi; Raphael P.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Robertazzi; Raphael P..The latest application filed is for "detection of performance degradation in integrated circuits".

Company Profile

7.10.11

Robertazzi; Raphael P. - Ossining NY
Robertazzi; Raphael P. - Yorktown Heights NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for the characterization and monitoring of integrated circuits Grant 11,169,200 - Robertazzi , et al. November 9, 2	2021-11-09
Detection of performance degradation in integrated circuits Grant 11,105,856 - Ray , et al. August 31, 2	2021-08-31
Method for the characterization and monitoring of integrated circuits Grant 11,061,063 - Robertazzi , et al. July 13, 2	2021-07-13
Detection Of Performance Degradation In Integrated Circuits App 20200150181 - Ray; Emily A. ; et al.	2020-05-14
Non-destructive analysis to determine use history of processor Grant 10,552,278 - Jenkins , et al. Fe	2020-02-04
Remote monitoring of software Grant 10,491,610 - Jenkins , et al. Nov	2019-11-26
Method For The Characterization And Monitoring Of Integrated Circuits App 20190353695 - Robertazzi; Raphael P. ; et al.	2019-11-21
Method for the characterization and monitoring of integrated circuits Grant 10,429,433 - Robertazzi , et al. October 1, 2	2019-10-01
Method For The Characterization And Monitoring Of Integrated Circuits App 20190285690 - Robertazzi; Raphael P. ; et al.	2019-09-19
Method for the characterization and monitoring of integrated circuits Grant 10,379,152 - Robertazzi , et al. A	2019-08-13
Non-destructive Analysis To Determine Use History Of Processor App 20180322025 - Jenkins; Keith A. ; et al.	2018-11-08
Non-destructive analysis to determine use history of processor Grant 10,102,090 - Jenkins , et al. October 16, 2	2018-10-16
Remote Monitoring Of Software App 20170339167 - Jenkins; Keith A. ; et al.	2017-11-23
Non-destructive Analysis To Determine Use History Of Processor App 20170329685 - Jenkins; Keith A. ; et al.	2017-11-16
Method for testing through silicon vias in 3D integrated circuits Grant 9,784,790 - Robertazzi October 10, 2	2017-10-10
Method For Testing Through Silicon Vias In 3d Integrated Circuits App 20170261549 - ROBERTAZZI; RAPHAEL P.	2017-09-14
Method For The Characterization And Monitoring Of Integrated Circuits App 20170067958 - Robertazzi; Raphael P. ; et al.	2017-03-09
Method for the characterization and monitoring of integrated circuits Grant 9,568,540 - Robertazzi , et al. February 14, 2	2017-02-14
Method For The Characterization And Monitoring Of Integrated Circuits App 20160223606 - Robertazzi; Raphael P. ; et al.	2016-08-04
Method For The Characterization And Monitoring Of Integrated Circuits App 20150247892 - Robertazzi; Raphael P. ; et al.	2015-09-03
Three-dimensional (3d) Stacked Integrated Circuit Testing App 20120112776 - Cher; Chen-Yong ; et al.	2012-05-10

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