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Silicon-on-insulator structure and method of reducing backside drain-induced barrier lowering Grant 6,642,133 - Roberds , et al. November 4, 2 | 2003-11-04 |
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Silicon-on-insulator structure and method of reducing backside drain-induced barrier lowering App 20030178680 - Roberds, Brian ;   et al. | 2003-09-25 |
Interfacial layer for gate electrode and high-k dielectric layer and methods of fabrication Grant 6,620,713 - Arghavani , et al. September 16, 2 | 2003-09-16 |
Method for bonding and debonding films using a high-temperature polymer App 20030170424 - Roberds, Brian ;   et al. | 2003-09-11 |
Technique to obtain high mobility channels in MOS transistors by forming a strain layer on an underside of a channel App 20030148584 - Roberds, Brian ;   et al. | 2003-08-07 |
Interfacial layer for gate electrode and high-k dielectric layer and methods of fabrication App 20030124871 - Arghavani, Reza ;   et al. | 2003-07-03 |
Silicon-on-insulator structure and method of reducing backside drain-induced barrier lowering App 20030116812 - Roberds, Brian ;   et al. | 2003-06-26 |
Method for bonding and debonding films using a high-temperature polymer App 20030108715 - Roberds, Brian ;   et al. | 2003-06-12 |
Technique to obtain high mobility channels in MOS transistors by forming a strain layer on an underside of a channel Grant 6,563,152 - Roberds , et al. May 13, 2 | 2003-05-13 |
Novel transistor structure and method of fabrication App 20030011037 - Chau, Robert S. ;   et al. | 2003-01-16 |
Novel transistor structure and method of fabrication App 20030001219 - Chau, Robert S. ;   et al. | 2003-01-02 |
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Method For Reduced Capacitance Interconnect System Using Gaseous Implants Into The Ild App 20020090791 - DOYLE, BRIAN S. ;   et al. | 2002-07-11 |
Technique to obtain high mobility channels in MOS transistors by forming a strain layer on an underside of a channel App 20020086472 - Roberds, Brian ;   et al. | 2002-07-04 |
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Methodology for control of short channel effects in MOS transistors App 20020074598 - Doyle, Brian S. ;   et al. | 2002-06-20 |
Technique to produce isolated junctions by forming an insulation layer Grant 6,399,973 - Roberds June 4, 2 | 2002-06-04 |
Methodology for control of short channel effects in MOS transistors Grant 6,362,082 - Doyle , et al. March 26, 2 | 2002-03-26 |
Technique to obtain increased channel mobilities in NMOS transistors by gate electrode engineering Grant 6,281,532 - Doyle , et al. August 28, 2 | 2001-08-28 |
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Method of increasing the mobility of MOS transistors by use of localized stress regions Grant 6,228,694 - Doyle , et al. May 8, 2 | 2001-05-08 |