Rizzolo; Richard F.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Rizzolo; Richard F..The latest application filed is for "adaptive power capping in a chip".
- Rizzolo; Richard F. - Red Hook NY
- Rizzolo; Richard F. - Poughkeepsie NY
| Patent | Date |
|---|---|
| Adaptive power capping in a chip Grant 10,048,734 - Lefurgy , et al. August 14, 2 | 2018-08-14 |
| Adaptive Power Capping In A Chip App 20180081413 - Lefurgy; Charles R. ; et al. | 2018-03-22 |
| Adaptive power capping in a chip Grant 9,874,917 - Lefurgy , et al. January 23, 2 | 2018-01-23 |
| Temperature-aware microprocessor voltage management Grant 9,733,685 - Lefurgy , et al. August 15, 2 | 2017-08-15 |
| Adaptive Power Capping In A Chip App 20170192477 - Lefurgy; Charles R. ; et al. | 2017-07-06 |
| Temperature-aware Microprocessor Voltage Management App 20170168534 - Lefurgy; Charles R. ; et al. | 2017-06-15 |
| Voltage droop reduction in a processor Grant 9,575,529 - Curran , et al. February 21, 2 | 2017-02-21 |
| Voltage Droop Reduction In A Processor App 20160098070 - CURRAN; Brian W. ; et al. | 2016-04-07 |
| Method and system for determining repeatable yield detractors of integrated circuits Grant 6,971,054 - Kurtulik , et al. November 29, 2 | 2005-11-29 |
| Method and system for determining repeatable yield detractors of integrated circuits Grant 6,751,765 - Rizzolo , et al. June 15, 2 | 2004-06-15 |
| Global transition scan based AC method Grant 6,662,324 - Motika , et al. December 9, 2 | 2003-12-09 |
| Method to improve a testability analysis of a hierarchical design Grant 6,532,571 - Gabrielson , et al. March 11, 2 | 2003-03-11 |
| Scan structure for improving transition fault coverage and scan diagnostics Grant 6,490,702 - Song , et al. December 3, 2 | 2002-12-03 |
| Method and apparatus for improving transition fault testability of semiconductor chips Grant 6,453,436 - Rizzolo , et al. September 17, 2 | 2002-09-17 |
| Method and system for determining repeatable yield detractors of integrated circuits App 20020125907 - Kurtulik, Raymond J. ; et al. | 2002-09-12 |
| Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis Grant 6,442,720 - Koprowski , et al. August 27, 2 | 2002-08-27 |
| Programmable clock tuning system and method Grant 5,455,931 - Camporese , et al. October 3, 1 | 1995-10-03 |
| Encoding for simultaneous switching output noise reduction Grant 5,142,167 - Temple , et al. August 25, 1 | 1992-08-25 |
| Two-level differential cascode current switch masterslice Grant 4,760,289 - Eichelberger , et al. July 26, 1 | 1988-07-26 |
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