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Patent applications and USPTO patent grants for Rinderknecht; Thomas H..The latest application filed is for "scan test application through high-speed serial input/outputs".
Patent | Date |
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Scan test application through high-speed serial input/outputs Grant 8,726,112 - Rajski , et al. May 13, 2 | 2014-05-13 |
High speed clock control Grant 8,448,008 - Hapke , et al. May 21, 2 | 2013-05-21 |
Performance of signature-based diagnosis for logic BIST Grant 8,448,032 - Sharma , et al. May 21, 2 | 2013-05-21 |
Scan Test Application Through High-Speed Serial Input/Outputs App 20100313089 - Rajski; Janusz ;   et al. | 2010-12-09 |
High Speed Clock Control App 20100251045 - HAPKE; Friedrich ;   et al. | 2010-09-30 |
Jitter measurement system and method App 20020106014 - Frisch, Arnold M. ;   et al. | 2002-08-08 |
Jitter measurement system and method Grant 6,295,315 - Frisch , et al. September 25, 2 | 2001-09-25 |
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