Rim; Min-Ho

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rim; Min-Ho.The latest application filed is for "systems and methods of testing semiconductor devices using simultaneously scanning of a plurality of regions therein and methods of forming semiconductor devices using the same".

Company Profile

2.3.4

Rim; Min-Ho - Hwaseong-si KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical measuring method and apparatus, and method of manufacturing semiconductor device using the same Grant 10,527,556 - Rim , et al. J	2020-01-07
Systems and methods of testing semiconductor devices using simultaneously scanning of a plurality of regions therein and methods of forming semiconductor devices using the same Grant 10,281,410 - Rim , et al.	2019-05-07
Systems And Methods Of Testing Semiconductor Devices Using Simultaneously Scanning Of A Plurality Of Regions Therein And Methods Of Forming Semiconductor Devices Using The Same App 20180356349 - Rim; Min Ho ; et al.	2018-12-13
Optical Measuring Method And Apparatus, And Method Of Manufacturing Semiconductor Device Using The Same App 20180340894 - RIM; Min-Ho ; et al.	2018-11-29
Semiconductor Device Inspection Apparatus And Method Of Driving The Same App 20180106731 - RIM; MIN HO ; et al.	2018-04-19
Method of detecting a defect of a substrate and apparatus for performing the same Grant 9,194,816 - Rim , et al. November 24, 2	2015-11-24
Method of Detecting a Defect of a Substrate and Apparatus for Performing the Same App 20150070690 - Rim; Min-Ho ; et al.	2015-03-12

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