loadpatents
Patent applications and USPTO patent grants for Rijpers; Bartolomeus Petrus.The latest application filed is for "lithographic method and apparatus".
Patent | Date |
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Lithographic method and apparatus Grant 11,106,144 - Koller , et al. August 31, 2 | 2021-08-31 |
Lithographic Method and Apparatus App 20210132507 - KOLLER; Paulus Hubertus Petrus ;   et al. | 2021-05-06 |
Position measuring method of an alignment target Grant 10,416,577 - Brinkhof , et al. Sept | 2019-09-17 |
Deposition Method and Apparatus App 20150343461 - RIJPERS; Bartolomeus Petrus ;   et al. | 2015-12-03 |
Deposition method and apparatus Grant 9,116,086 - Rijpers , et al. August 25, 2 | 2015-08-25 |
Substrate comprising a mark Grant 8,722,179 - Van Haren , et al. May 13, 2 | 2014-05-13 |
Substrate comprising a mark Grant 8,609,441 - Van Haren , et al. December 17, 2 | 2013-12-17 |
Deposition Method and Apparatus App 20100330280 - Rijpers; Bartolomeus Petrus ;   et al. | 2010-12-30 |
Marker Structure And Method For Controlling Alignment Of Layers Of A Multi-layered Substrate App 20100068830 - VAN HAREN; Richard Johannes Franciscus ;   et al. | 2010-03-18 |
Marker structure and method for controlling alignment of layers of a multi-layered substrate Grant 7,629,697 - Van Haren , et al. December 8, 2 | 2009-12-08 |
Substrate comprising a mark App 20080212057 - Van Haren; Richard Johannes Franciscus ;   et al. | 2008-09-04 |
Substrate comprising a mark App 20080138623 - Franciscus Van Haren; Richard Johannes ;   et al. | 2008-06-12 |
Method of depositing a metal layer onto a substrate and a method for measuring in three dimensions the topographical features of a substrate App 20070093044 - Rijpers; Bartolomeus Petrus ;   et al. | 2007-04-26 |
Marker structure and method for controlling alignment of layers of a multi-layered substrate App 20060103033 - Van Haren; Richard Johannes Franciscus ;   et al. | 2006-05-18 |
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