loadpatents
name:-0.010437965393066
name:-0.0072290897369385
name:-0.0024628639221191
Rijpers; Bartolomeus Petrus Patent Filings

Rijpers; Bartolomeus Petrus

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rijpers; Bartolomeus Petrus.The latest application filed is for "lithographic method and apparatus".

Company Profile
1.9.8
  • Rijpers; Bartolomeus Petrus - Nuenen NL
  • Rijpers; Bartolomeus Petrus - Neunen NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Lithographic method and apparatus
Grant 11,106,144 - Koller , et al. August 31, 2
2021-08-31
Lithographic Method and Apparatus
App 20210132507 - KOLLER; Paulus Hubertus Petrus ;   et al.
2021-05-06
Position measuring method of an alignment target
Grant 10,416,577 - Brinkhof , et al. Sept
2019-09-17
Deposition Method and Apparatus
App 20150343461 - RIJPERS; Bartolomeus Petrus ;   et al.
2015-12-03
Deposition method and apparatus
Grant 9,116,086 - Rijpers , et al. August 25, 2
2015-08-25
Substrate comprising a mark
Grant 8,722,179 - Van Haren , et al. May 13, 2
2014-05-13
Substrate comprising a mark
Grant 8,609,441 - Van Haren , et al. December 17, 2
2013-12-17
Deposition Method and Apparatus
App 20100330280 - Rijpers; Bartolomeus Petrus ;   et al.
2010-12-30
Marker Structure And Method For Controlling Alignment Of Layers Of A Multi-layered Substrate
App 20100068830 - VAN HAREN; Richard Johannes Franciscus ;   et al.
2010-03-18
Marker structure and method for controlling alignment of layers of a multi-layered substrate
Grant 7,629,697 - Van Haren , et al. December 8, 2
2009-12-08
Substrate comprising a mark
App 20080212057 - Van Haren; Richard Johannes Franciscus ;   et al.
2008-09-04
Substrate comprising a mark
App 20080138623 - Franciscus Van Haren; Richard Johannes ;   et al.
2008-06-12
Method of depositing a metal layer onto a substrate and a method for measuring in three dimensions the topographical features of a substrate
App 20070093044 - Rijpers; Bartolomeus Petrus ;   et al.
2007-04-26
Marker structure and method for controlling alignment of layers of a multi-layered substrate
App 20060103033 - Van Haren; Richard Johannes Franciscus ;   et al.
2006-05-18

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