Patent | Date |
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Semiconductor device performing refresh operation in deep sleep mode Grant 11,335,393 - Riho , et al. May 17, 2 | 2022-05-17 |
Apparatuses and methods for error correction coding and data bus inversion for semiconductor memories Grant 11,314,591 - Riho , et al. April 26, 2 | 2022-04-26 |
Memory Devices With Multiple Sets Of Latencies And Methods For Operating The Same App 20210357137 - Gans; Dean D. ;   et al. | 2021-11-18 |
Memory devices with multiple sets of latencies and methods for operating the same Grant 11,150,821 - Gans , et al. October 19, 2 | 2021-10-19 |
Semiconductor Device Performing Refresh Operation In Deep Sleep Mode App 20210166753 - Riho; Yoshiro ;   et al. | 2021-06-03 |
Memory devices with multiple sets of latencies and methods for operating the same Grant 10,976,945 - Gans , et al. April 13, 2 | 2021-04-13 |
Semiconductor device performing refresh operation in deep sleep mode Grant 10,923,171 - Riho , et al. February 16, 2 | 2021-02-16 |
Apparatuses And Methods For Error Correction Coding And Data Bus Inversion For Semiconductor Memories App 20200409786 - Riho; Yoshiro ;   et al. | 2020-12-31 |
Apparatuses and methods for error correction coding and data bus inversion for semiconductor memories Grant 10,795,759 - Riho , et al. October 6, 2 | 2020-10-06 |
Semiconductor Device Performing Refresh Operation In Deep Sleep Mode App 20200126611 - Riho; Yoshiro ;   et al. | 2020-04-23 |
Apparatuses And Methods For Error Correction Coding And Data Bus Inversion For Semiconductor Memories App 20200081769 - Riho; Yoshiro ;   et al. | 2020-03-12 |
Testing circuits in stacked wafers using a connected electrode in the first wafer Grant RE47,840 - Riho Fe | 2020-02-04 |
Memory Devices With Multiple Sets Of Latencies And Methods For Operating The Same App 20190369894 - Gans; Dean D. ;   et al. | 2019-12-05 |
Memory devices with multiple sets of latencies and methods for operating the same Grant 10,481,819 - Gans , et al. Nov | 2019-11-19 |
Memory Devices With Multiple Sets Of Latencies And Methods For Operating The Same App 20190129637 - Gans; Dean D. ;   et al. | 2019-05-02 |
Memory Devices With Multiple Sets Of Latencies And Methods For Operating The Same App 20190129635 - Gans; Dean D. ;   et al. | 2019-05-02 |
Partial access mode for dynamic random access memory Grant 10,020,045 - Riho July 10, 2 | 2018-07-10 |
Partial access mode for dynamic random access memory Grant 9,640,240 - Riho May 2, 2 | 2017-05-02 |
Semiconductor device performing stress test Grant 9,053,821 - Riho , et al. June 9, 2 | 2015-06-09 |
Partial Access Mode For Dynamic Random Access Memory App 20150149717 - RIHO; Yoshiro | 2015-05-28 |
Partial Access Mode For Dynamic Random Access Memory App 20150146494 - Riho; Yoshiro | 2015-05-28 |
Semiconductor device having a control chip stacked with a controlled chip Grant 8,988,919 - Riho March 24, 2 | 2015-03-24 |
Calibration of impedance Grant 8,937,488 - Riho January 20, 2 | 2015-01-20 |
Semiconductor device and method of manufacturing the same Grant 8,938,570 - Riho January 20, 2 | 2015-01-20 |
Semiconductor device Grant 8,908,411 - Riho December 9, 2 | 2014-12-09 |
Semiconductor Device And Method Of Manufacturing The Same App 20140321223 - RIHO; Yoshiro | 2014-10-30 |
Semiconductor device and method including redundant bit line provided to replace defective bit line Grant 8,837,242 - Riho , et al. September 16, 2 | 2014-09-16 |
Semiconductor Device Having A Control Chip Stacked With A Controlled Chip App 20140247683 - RIHO; Yoshiro | 2014-09-04 |
Device App 20140232429 - RIHO; Yoshiro | 2014-08-21 |
Semiconductor Device Performing Stress Test App 20140211582 - Riho; Yoshiro ;   et al. | 2014-07-31 |
Semiconductor device and method of manufacturing the same Grant 8,788,738 - Riho July 22, 2 | 2014-07-22 |
Semiconductor device having a control chip stacked with a controlled chip Grant 8,760,901 - Riho June 24, 2 | 2014-06-24 |
Device Grant 8,749,267 - Riho June 10, 2 | 2014-06-10 |
Semiconductor device performing stress test Grant 8,737,149 - Riho , et al. May 27, 2 | 2014-05-27 |
Semiconductor Device And Method Including Redundant Bit Line Provided To Replace Defective Bit Line App 20140140155 - Riho; Yoshiro ;   et al. | 2014-05-22 |
Semiconductor device having sense amplifier Grant 8,659,321 - Watanabe , et al. February 25, 2 | 2014-02-25 |
Semiconductor Device App 20140043885 - RIHO; Yoshiro | 2014-02-13 |
Semiconductor device having redundant bit line provided to replace defective bit line Grant 8,638,625 - Riho , et al. January 28, 2 | 2014-01-28 |
Semiconductor device Grant 8,599,596 - Riho December 3, 2 | 2013-12-03 |
Semiconductor device Grant 8,503,261 - Riho August 6, 2 | 2013-08-06 |
Semiconductor device, system with semiconductor device, and calibration method Grant 8,483,986 - Riho July 9, 2 | 2013-07-09 |
Device App 20130093492 - RIHO; Yoshiro | 2013-04-18 |
Device App 20130094272 - RIHO; Yoshiro | 2013-04-18 |
Semiconductor device with anti-fuse elements Grant 8,422,329 - Riho April 16, 2 | 2013-04-16 |
Semiconductor Device App 20130039112 - RIHO; Yoshiro | 2013-02-14 |
Semiconductor device Grant 8,310,855 - Riho November 13, 2 | 2012-11-13 |
Semiconductor Device App 20120262198 - RIHO; Yoshiro | 2012-10-18 |
Semiconductor Device Having Redundant Bit Line Provided To Replace Defective Bit Line App 20120213021 - Riho; Yoshiro ;   et al. | 2012-08-23 |
Semiconductor device Grant 8,243,486 - Riho August 14, 2 | 2012-08-14 |
Semiconductor Device And Method Of Manufacturing The Same App 20120146707 - RIHO; Yoshiro | 2012-06-14 |
Semiconductor Device Having Sense Amplifier App 20120133399 - WATANABE; Yuko ;   et al. | 2012-05-31 |
Semiconductor Device Performing Stress Test App 20120127814 - RIHO; Yoshiro ;   et al. | 2012-05-24 |
Semiconductor memory device Grant 8,116,156 - Riho , et al. February 14, 2 | 2012-02-14 |
Semiconductor Device App 20110261630 - RIHO; Yoshiro | 2011-10-27 |
Semiconductor memory device, control method therefor, and method for determining repair possibility of defective address Grant 7,940,583 - Riho , et al. May 10, 2 | 2011-05-10 |
Semiconductor device, system with semiconductor device, and calibration method App 20110102073 - Riho; Yoshiro | 2011-05-05 |
Sense Amplifier Circuit To Enable Speeding-up Of Readout Of Information From Memory Cells App 20110096616 - KUBOUCHI; Shuichi ;   et al. | 2011-04-28 |
Device App 20110085366 - Riho; Yoshiro | 2011-04-14 |
Semiconductor Device App 20110026293 - RIHO; Yoshiro | 2011-02-03 |
Semiconductor memory device Grant 7,864,618 - Riho , et al. January 4, 2 | 2011-01-04 |
Semiconductor device Grant 7,796,453 - Riho , et al. September 14, 2 | 2010-09-14 |
Semiconductor device App 20100195364 - Riho; Yoshiro | 2010-08-05 |
Semiconductor memory device and control method thereof Grant 7,764,553 - Riho July 27, 2 | 2010-07-27 |
Semiconductor Memory Device And Testing Method Therefor App 20100122131 - RIHO; YOSHIRO | 2010-05-13 |
Semiconductor memory device and control method thereof App 20100110808 - Riho; Yoshiro | 2010-05-06 |
Semiconductor memory device having sense amplifier App 20100103758 - Riho; Yoshiro ;   et al. | 2010-04-29 |
Reference voltage generating circuit and semiconductor integrated circuit device Grant 7,642,843 - Riho January 5, 2 | 2010-01-05 |
Semiconductor memory device, control method therefor, and method for determining repair possibility of defective address App 20090201753 - Riho; Yoshiro ;   et al. | 2009-08-13 |
Semiconductor memory device App 20090201752 - Riho; Yoshiro ;   et al. | 2009-08-13 |
Semiconductor device and testing method for same Grant 7,529,986 - Riho , et al. May 5, 2 | 2009-05-05 |
Semiconductor Device App 20090003107 - Riho; Yoshiro ;   et al. | 2009-01-01 |
Semiconductor Memory Device App 20090003026 - Riho; Yoshiro ;   et al. | 2009-01-01 |
Semiconductor Memory Device, Semiconductor Device, Memory System And Refresh Control Method App 20080212386 - RIHO; Yoshiro | 2008-09-04 |
Reference Voltage Generating Circuit And Semiconductor Integrated Circuit Device App 20080211572 - RIHO; Yoshiro | 2008-09-04 |
Semiconductor Device And Testing Method For Same App 20080133985 - RIHO; Yoshiro ;   et al. | 2008-06-05 |
Semiconductor storage device and refresh control method therefor Grant 7,355,919 - Riho , et al. April 8, 2 | 2008-04-08 |
Semiconductor device having pseudo power supply wiring and method of designing the same App 20080067551 - Riho; Yoshiro ;   et al. | 2008-03-20 |
Semiconductor device and testing method for same Grant 7,346,829 - Riho , et al. March 18, 2 | 2008-03-18 |
Semiconductor storage device and refresh control method therefor App 20070230265 - Riho; Yoshiro ;   et al. | 2007-10-04 |
Semiconductor storage device and refresh control method therefor Grant 7,260,011 - Riho , et al. August 21, 2 | 2007-08-21 |
Refresh control method of a semiconductor memory device and semiconductor memory device Grant 7,248,528 - Riho , et al. July 24, 2 | 2007-07-24 |
Semiconductor storage device and refresh control method therefor App 20070097772 - Riho; Yoshiro ;   et al. | 2007-05-03 |
Semiconductor storage device and refresh control method therefor Grant 7,167,403 - Riho , et al. January 23, 2 | 2007-01-23 |
Semiconductor storage device and method of controlling refreshing of semiconductor storage device Grant 7,158,433 - Riho , et al. January 2, 2 | 2007-01-02 |
Refresh control method of a semiconductor memory device and semiconductor memory device App 20060087903 - Riho; Yoshiro ;   et al. | 2006-04-27 |
Semiconductor device and testing method for same App 20050229076 - Riho, Yoshiro ;   et al. | 2005-10-13 |
Semiconductor storage device and method of controlling refreshing of semiconductor storage device App 20050219890 - Riho, Yoshiro ;   et al. | 2005-10-06 |
Semiconductor storage device and refresh control method therefor App 20050169083 - Riho, Yoshiro ;   et al. | 2005-08-04 |
Semiconductor integrated circuit device having an optimal circuit layout to ensure stabilization of internal source voltages without lowering circuit functions and/or operating performance App 20020130714 - Riho, Yoshiro ;   et al. | 2002-09-19 |
Semiconductor integrated circuit device Grant 6,411,160 - Riho , et al. June 25, 2 | 2002-06-25 |