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Riedesel; Christof Patent Filings

Riedesel; Christof

Patent Applications and Registrations

Patent applications and USPTO patent grants for Riedesel; Christof.The latest application filed is for "multiple particle beam microscope and associated method with an improved focus setting taking into account an image plane tilt".

Company Profile
10.15.20
  • Riedesel; Christof - Aalen DE
  • Riedesel; Christof - Essingen DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Multiple Particle Beam Microscope And Associated Method With An Improved Focus Setting Taking Into Account An Image Plane Tilt
App 20220246388 - Rauwolf; Nicole ;   et al.
2022-08-04
Charged Particle Beam System
App 20220108864 - Zeidler; Dirk ;   et al.
2022-04-07
Multi-beam particle beam system
Grant 11,239,054 - Sarov , et al. February 1, 2
2022-02-01
Charged particle beam system
Grant 11,164,715 - Zeidler , et al. November 2, 2
2021-11-02
Method Of Recording An Image Using A Particle Microscope
App 20210296089 - Zeidler; Dirk ;   et al.
2021-09-23
Multi-beam charged particle system
Grant 11,087,948 - Zeidler , et al. August 10, 2
2021-08-10
Multi-beam Particle Beam System And Method For Operating Same
App 20210217577 - Zeidler; Dirk ;   et al.
2021-07-15
Method For Detector Equalization During The Imgaging Of Objects With A Multi-beam Particle Microscope
App 20210192700 - Zeidler; Dirk ;   et al.
2021-06-24
Multi-beam Particle Beam System
App 20210066037 - Sarov; Yanko ;   et al.
2021-03-04
Charged Particle Beam System
App 20200411274 - Zeidler; Dirk ;   et al.
2020-12-31
Multi-beam particle beam system
Grant 10,854,423 - Sarov , et al. December 1, 2
2020-12-01
Multi-beam Charged Particle System
App 20200357600 - Zeidler; Dirk ;   et al.
2020-11-12
Charged particle beam system
Grant 10,811,215 - Zeidler , et al. October 20, 2
2020-10-20
Multi-beam charged particle system
Grant 10,741,355 - Zeidler , et al. A
2020-08-11
Multi-beam Charged Particle System
App 20200251301 - Kind Code
2020-08-06
Particle beam system
Grant 10,600,613 - Zeidler , et al.
2020-03-24
Charged Particle Beam System
App 20190355545 - Zeidler; Dirk ;   et al.
2019-11-21
Multi-beam Particle Beam System
App 20190259575 - Sarov; Yanko ;   et al.
2019-08-22
Particle Beam System
App 20190088440 - Zeidler; Dirk ;   et al.
2019-03-21
Particle beam system
Grant 10,147,582 - Zeidler , et al. De
2018-12-04
Particle beam system and method for operating a particle optical unit
Grant 9,991,089 - Mueller , et al. June 5, 2
2018-06-05
Particle Beam System And Method For Operating A Particle Optical Unit
App 20180040454 - Mueller; Ingo ;   et al.
2018-02-08
Particle beam system and method for operating a particle optical unit
Grant 9,799,485 - Mueller , et al. October 24, 2
2017-10-24
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
Grant 9,653,254 - Zeidler , et al. May 16, 2
2017-05-16
Particle Beam System
App 20170133194 - Zeidler; Dirk ;   et al.
2017-05-11
Particle beam system
Grant 9,552,957 - Zeidler , et al. January 24, 2
2017-01-24
Multi-beam particle microscope and method for operating same
Grant 9,536,702 - Lang , et al. January 3, 2
2017-01-03
Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
Grant 9,384,938 - Zeidler , et al. July 5, 2
2016-07-05
Particle-Optical Systems and Arrangements and Particle-Optical Components for such Systems and Arrangements
App 20160155603 - Zeidler; Dirk ;   et al.
2016-06-02
Particle Beam System And Method For Operating A Particle Optical Unit
App 20150357157 - Mueller; Ingo ;   et al.
2015-12-10
Particle Beam System
App 20150348738 - Zeidler; Dirk ;   et al.
2015-12-03
Multi-beam Particle Microscope And Method For Operating Same
App 20150348749 - Lang; Uwe ;   et al.
2015-12-03
Particle-Optical Systems and Arrangements and Particle-Optical Components for such Systems and Arrangements
App 20130187046 - Zeidler; Dirk ;   et al.
2013-07-25

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