Rickert; Dennis Martin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rickert; Dennis Martin.The latest application filed is for "implementing spare latch placement quality determination".

Company Profile

0.5.5

Rickert; Dennis Martin - Rochester MN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Implementing spare latch placement quality determination Grant 8,296,707 - Amundson , et al. October 23, 2	2012-10-23
Implementing Spare Latch Placement Quality Determination App 20120124541 - Amundson; Michael David ; et al.	2012-05-17
Implementing logic security feature for disabling integrated circuit test ports ability to scanout data Grant 8,166,357 - Pruden , et al. April 24, 2	2012-04-24
Implementing at-speed Wafer Final Test (WFT) with complete chip coverage Grant 7,852,103 - Bartley , et al. December 14, 2	2010-12-14
Implementing At-speed Wafer Final Test (wft) With Complete Chip Coverage App 20100271046 - Bartley; Gerald Keith ; et al.	2010-10-28
Method and dual interlocked storage cell latch for implementing enhanced testability Grant 7,661,046 - Rickert , et al. February 9, 2	2010-02-09
Method and dual interlocked storage cell latch for implementing enhanced testability Grant 7,661,047 - Rickert , et al. February 9, 2	2010-02-09
Method and Apparatus for Implementing Logic Security Feature for Disabling Integrated Circuit Test Ports Ability to Scanout Data App 20090172819 - Pruden; David Warren ; et al.	2009-07-02
Method and Dual Interlocked Storage Cell Latch for Implementing Enhanced Testability App 20080222468 - Rickert; Dennis Martin ; et al.	2008-09-11
Method and Dual Interlocked Storage Cell Latch for Implementing Enhanced Testability App 20080222469 - Rickert; Dennis Martin ; et al.	2008-09-11

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