Richard; Glen E
Patent Applications and Registrations
Patent applications and USPTO patent grants for Richard; Glen E.The latest application filed is for "separation of integrated circuit structure from adjacent chip".
- Richard; Glen E - Burlington VT
- Richard; Glen E. - Essex Junction VT
- Richard; Glen E. - Burlington VT
| Patent | Date |
|---|---|
| Separation of integrated circuit structure from adjacent chip Grant 10,256,204 - Richard , et al. | 2019-04-09 |
| Chip joining by induction heating Grant 10,245,667 - Ayotte , et al. | 2019-04-02 |
| Method for semiconductor die removal rework Grant 10,050,012 - Ayotte , et al. August 14, 2 | 2018-08-14 |
| Separation Of Integrated Circuit Structure From Adjacent Chip App 20180130733 - Richard; Glen E. ; et al. | 2018-05-10 |
| Chip Joining By Induction Heating App 20170312841 - Ayotte; Stephen P. ; et al. | 2017-11-02 |
| Chip joining by induction heating Grant 9,776,270 - Ayotte , et al. October 3, 2 | 2017-10-03 |
| Visually detecting electrostatic discharge events Grant 9,711,422 - Ayotte , et al. July 18, 2 | 2017-07-18 |
| Semiconductor Structure And Method Of Making App 20170200699 - Ayotte; Stephen P. ; et al. | 2017-07-13 |
| Semiconductor structure and method of making Grant 9,704,830 - Ayotte , et al. July 11, 2 | 2017-07-11 |
| Method And Structure For Semiconductor Die Removal Rework App 20170148762 - Ayotte; Stephen P. ; et al. | 2017-05-25 |
| Reliability monitor test strategy definition Grant 9,645,573 - Ayotte , et al. May 9, 2 | 2017-05-09 |
| Induction Heating For Underfill Removal And Chip Rework App 20160372444 - Ayotte; Stephen P. ; et al. | 2016-12-22 |
| Induction heating for underfill removal and chip rework Grant 9,508,680 - Ayotte , et al. November 29, 2 | 2016-11-29 |
| IC structure with recessed solder bump area and methods of forming same Grant 9,472,490 - Sullivan , et al. October 18, 2 | 2016-10-18 |
| Reliability Monitor Test Strategy Definition App 20160147220 - Ayotte; Stephen P. ; et al. | 2016-05-26 |
| Visually Detecting Electrostatic Discharge Events App 20150355253 - Ayotte; Stephen P. ; et al. | 2015-12-10 |
| Solder bump reflow by induction heating Grant 9,190,375 - Ayotte , et al. November 17, 2 | 2015-11-17 |
| Reducing thermal energy transfer during chip-join processing Grant 9,177,931 - Ayotte , et al. November 3, 2 | 2015-11-03 |
| Solder Bump Reflow By Induction Heating App 20150294948 - Ayotte; Stephen P. ; et al. | 2015-10-15 |
| Reducing Thermal Energy Transfer During Chip-join Processing App 20150243618 - Ayotte; Stephen P. ; et al. | 2015-08-27 |
| Visually detecting electrostatic discharge events Grant 9,105,573 - Ayotte , et al. August 11, 2 | 2015-08-11 |
| Inhibiting propagation of imperfections in semiconductor devices Grant 9,059,097 - Ayotte , et al. June 16, 2 | 2015-06-16 |
| Chip Joining By Induction Heating App 20150089805 - Ayotte; Stephen P. ; et al. | 2015-04-02 |
| Controlled collapse chip connection (C4) structure and methods of forming Grant 8,765,593 - Ayotte , et al. July 1, 2 | 2014-07-01 |
| Controlled Collapse Chip Connection (c4) Structure And Methods Of Forming App 20140042630 - Ayotte; Stephen P. ; et al. | 2014-02-13 |
| Inhibiting Propagation Of Imperfections In Semiconductor Devices App 20140042594 - Ayotte; Stephen P. ; et al. | 2014-02-13 |
| Visually Detecting Electrostatic Discharge Events App 20130257624 - AYOTTE; Stephen P. ; et al. | 2013-10-03 |
| Internal cache for on chip test data storage Grant 6,901,542 - Bartenstein , et al. May 31, 2 | 2005-05-31 |
| Incremental fault dictionary Grant 6,675,323 - Bartenstein , et al. January 6, 2 | 2004-01-06 |
| Incremental fault dictionary App 20030046608 - Bartenstein, Thomas W. ; et al. | 2003-03-06 |
| Internal cache for on chip test data storage App 20030033566 - Bartenstein, Thomas W. ; et al. | 2003-02-13 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 