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Patent applications and USPTO patent grants for Renesas Electric Corporation.The latest application filed is for "semiconductor device and diagnostic test method".
Patent | Date |
---|---|
Semiconductor device and diagnostic test method for both single-point and latent faults using first and second scan tests Grant 10,281,525 - Maeda , et al. | 2019-05-07 |
Semiconductor Device And Diagnostic Test Method App 20180180672 - MAEDA; Yoichi ;   et al. | 2018-06-28 |
Semiconductor device and method of manufacturing the same Grant 9,887,301 - Makiyama February 6, 2 | 2018-02-06 |
Data processing system Grant 8,860,593 - Kimura , et al. October 14, 2 | 2014-10-14 |
Manufacturing method of semiconductor device Grant 8,629,002 - Kuroda , et al. January 14, 2 | 2014-01-14 |
Manufacturing Method Of Semiconductor Device App 20130065364 - KURODA; Soshi ;   et al. | 2013-03-14 |
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