Reinhorn; Silviu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Reinhorn; Silviu.The latest application filed is for "particle detection assembly, system and method".
Company Profile
2.24.25
- Reinhorn; Silviu - Mevaseret Zion IL
- Reinhorn; Silviu - Mevasert-Zion IL
- Reinhorn; Silviu - Mevasseret-Zion IL
- Reinhorn; Silviu - Yavne IL
Patent Activity
| Patent | Date |
|---|---|
| Particle detection assembly, system and method Grant 10,910,193 - Cheifetz , et al. February 2, 2 | 2021-02-02 |
| Particle Detection Assembly, System And Method App 20190259571 - CHEIFETZ; ELI ; et al. | 2019-08-22 |
| Detection assembly, system and method Grant 10,236,155 - Cheifetz , et al. | 2019-03-19 |
| Detection Assembly, System And Method App 20170069459 - CHEIFETZ; ELI ; et al. | 2017-03-09 |
| Position sensitive STEM detector Grant 9,076,632 - Reinhorn , et al. July 7, 2 | 2015-07-07 |
| Position Sensitive Stem Detector App 20150034822 - Reinhorn; Silviu ; et al. | 2015-02-05 |
| High resolution wafer inspection system Grant 7,973,919 - Grossman , et al. July 5, 2 | 2011-07-05 |
| Wafer Inspection System App 20110141462 - Reinhorn; Silviu ; et al. | 2011-06-16 |
| High Resolution Wafer Inspection System App 20100188658 - Grossman; Dan ; et al. | 2010-07-29 |
| High resolution wafer inspection system Grant 7,714,999 - Grossman , et al. May 11, 2 | 2010-05-11 |
| Method and apparatus for article inspection including speckle reduction Grant 7,463,352 - Karpol , et al. December 9, 2 | 2008-12-09 |
| High Resolution Wafer Inspection System App 20080231845 - Grossman; Dan ; et al. | 2008-09-25 |
| Multi beam scanning with bright/dark field imaging Grant 7,399,647 - Reinhorn July 15, 2 | 2008-07-15 |
| Multi beam scanning with bright/dark field imaging Grant 7,190,459 - Reinhorn March 13, 2 | 2007-03-13 |
| Collapsible portable display App 20060232578 - Reinhorn; Silviu | 2006-10-19 |
| Collapsible portable display App 20060234784 - Reinhorn; Silviu | 2006-10-19 |
| Wafer defect detection system with traveling lens multi-beam scanner Grant 7,053,395 - Feldman , et al. May 30, 2 | 2006-05-30 |
| Multi beam scanning with bright/dark field imaging Grant 7,049,586 - Reinhorn May 23, 2 | 2006-05-23 |
| Multi beam scanning with bright/dark field imaging App 20060028649 - Reinhorn; Silviu | 2006-02-09 |
| Wafer inspection system App 20060012791 - Reinhorn; Silviu ; et al. | 2006-01-19 |
| Method and apparatus for article inspection including speckle reduction Grant 6,924,891 - Karpol , et al. August 2, 2 | 2005-08-02 |
| Method and apparatus for article inspection including speckle reduction App 20050128473 - Karpol, Avner ; et al. | 2005-06-16 |
| Multi beam scanning with bright/dark field imaging App 20050030527 - Reinhorn, Silviu | 2005-02-10 |
| Wafer defect detection system with traveling lens multi-beam scanner Grant 6,853,475 - Feldman , et al. February 8, 2 | 2005-02-08 |
| Variable angle illumination wafer inspection system Grant 6,853,446 - Almogy , et al. February 8, 2 | 2005-02-08 |
| Multi Beam Scanning With Bright/dark Field Imaging App 20040235208 - REINHORN, Silviu | 2004-11-25 |
| Wafer defect detection system with traveling lens multi-beam scanner Grant 6,809,808 - Feldman , et al. October 26, 2 | 2004-10-26 |
| Method and apparatus for article inspection including speckle reduction App 20040201842 - Karpol, Avner ; et al. | 2004-10-14 |
| Method and apparatus for article inspection including speckle reduction Grant 6,798,505 - Karpol , et al. September 28, 2 | 2004-09-28 |
| Laser scanning wafer inspection using nonlinear optical phenomena Grant 6,791,099 - Some , et al. September 14, 2 | 2004-09-14 |
| Multi-beam polygon scanning system Grant 6,788,445 - Goldberg , et al. September 7, 2 | 2004-09-07 |
| Wafer defect detection system with traveling lens multi-beam scanner App 20040080740 - Feldman, Haim ; et al. | 2004-04-29 |
| Wafer defect detection system with traveling lens multi-beam scanner App 20040075068 - Feldman, Haim ; et al. | 2004-04-22 |
| Method and apparatus for inspection of patterned semiconductor wafers Grant 6,671,398 - Reinhorn , et al. December 30, 2 | 2003-12-30 |
| Method and apparatus for article inspection including speckle reduction App 20030197858 - Karpol, Avner ; et al. | 2003-10-23 |
| Multi-beam polygon scanning system App 20030184835 - Goldberg, Boris ; et al. | 2003-10-02 |
| Wafer defect detection system with traveling lens multi-beam scanner App 20030179369 - Feldman, Haim ; et al. | 2003-09-25 |
| Multi beam scanning with bright/dark field imaging App 20030156280 - Reinhorn, Silviu | 2003-08-21 |
| Method of and apparatus for article inspection including speckle reduction Grant 6,587,194 - Karpol , et al. July 1, 2 | 2003-07-01 |
| Method of and apparatus for article inspection including speckle reduction Grant 6,556,294 - Karpol , et al. April 29, 2 | 2003-04-29 |
| Laser scanning wafer inspection using nonlinear optical phenomena App 20020109110 - Some, Daniel I. ; et al. | 2002-08-15 |
| Method of and apparatus for article inspection including speckle reduction App 20020080348 - Karpol, Avner ; et al. | 2002-06-27 |
| Method of and apparatus for article inspection including speckle reduction App 20020067478 - Karpol, Avner ; et al. | 2002-06-06 |
| Method and apparatus for article inspection including speckel reduction App 20020057427 - Karpol, Avner ; et al. | 2002-05-16 |
| Method and apparatus for article inspection including speckle reduction Grant 6,369,888 - Karpol , et al. April 9, 2 | 2002-04-09 |
| Method and apparatus for inspection of patterned semiconductor wafers App 20020034325 - Reinhorn, Silviu ; et al. | 2002-03-21 |
| Compact planar optical correlator Grant 6,185,015 - Reinhorn , et al. February 6, 2 | 2001-02-06 |
| Compact optical crossbar switch Grant 6,172,778 - Reinhorn , et al. January 9, 2 | 2001-01-09 |
| Planar holographic optical device Grant 5,966,223 - Friesem , et al. October 12, 1 | 1999-10-12 |
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