Regensburger; Menachem
Patent Applications and Registrations
Patent applications and USPTO patent grants for Regensburger; Menachem.The latest application filed is for "automatic defect classification".
- Regensburger; Menachem - Shimshit IL
| Patent | Date |
|---|---|
| Automatic Defect Classification App 20220214287 - Regensburger; Menachem ; et al. | 2022-07-07 |
| Automatic defect classification Grant 11,300,521 - Regensburger , et al. April 12, 2 | 2022-04-12 |
| Hierarchical wafer inspection Grant 10,732,128 - Regensburger | 2020-08-04 |
| Migdal Haemeq App 20200141879 - Regensburger; Menachem ; et al. | 2020-05-07 |
| Objective lens Grant 10,598,607 - Ben Ezer , et al. | 2020-03-24 |
| Continuous light inspection Grant 10,497,092 - Koren , et al. De | 2019-12-03 |
| Hierarchical Wafer Inspection App 20190128822 - Regensburger; Menachem | 2019-05-02 |
| Inspection system and a method for inspecting a diced wafer Grant 10,203,289 - Postolov , et al. Feb | 2019-02-12 |
| Objective Lens App 20190033234 - Ben Ezer; Zehava ; et al. | 2019-01-31 |
| Inspecting a wafer using image and design information Grant 10,042,974 - Postolov , et al. August 7, 2 | 2018-08-07 |
| Inspecting A Wafer Using Image And Design Information App 20170344697 - Postolov; Yuri ; et al. | 2017-11-30 |
| High throughput and low cost height triangulation system and method Grant 9,756,313 - Koren , et al. September 5, 2 | 2017-09-05 |
| Continuous Light Inspection App 20170150104 - KOREN; SHIMON ; et al. | 2017-05-25 |
| High Throughput And Low Cost Height Triangulation System And Method App 20140362208 - Koren; Shimon ; et al. | 2014-12-11 |
| Inspection recipe generation and inspection based on an inspection recipe Grant 8,699,784 - Langmatz , et al. April 15, 2 | 2014-04-15 |
| System and method for inspection Grant 8,290,243 - Lev , et al. October 16, 2 | 2012-10-16 |
| Inspection system and a method for detecting defects based upon a reference frame Grant 8,238,645 - Postolov , et al. August 7, 2 | 2012-08-07 |
| Inspection system and a method for detecting defects based upon a reference frame Grant 8,233,699 - Postolov , et al. July 31, 2 | 2012-07-31 |
| Method and system for inspecting a diced wafer Grant 8,208,713 - Postolov , et al. June 26, 2 | 2012-06-26 |
| Inspection Recipe Generation And Inspection Based On An Inspection Recipe App 20120057773 - LANGMATZ; ELDAD ; et al. | 2012-03-08 |
| Method for establishing a wafer testing recipe Grant 8,089,058 - Regensburger January 3, 2 | 2012-01-03 |
| Method And A System For Creating A Reference Image Using Unknown Quality Patterns App 20110164129 - Postolov; Yuri ; et al. | 2011-07-07 |
| System And Method For Inspection App 20100245566 - LEV; MICHAEL ; et al. | 2010-09-30 |
| Method And System For Imaging An Electrical Circuit App 20100194877 - Regensburger; Menachem | 2010-08-05 |
| Inspection System And A Method For Detecting Defects Based Upon A Reference Frame App 20090304260 - Postolov; Yuri ; et al. | 2009-12-10 |
| Method And A System For Establishing An Inspection-recipe App 20090290782 - Regensburger; Menachem | 2009-11-26 |
| Method and system for inspecting a diced wafer App 20090116726 - Postolov; Yuri ; et al. | 2009-05-07 |
| Inspection System and a Method for Detecting Defects Based Upon a Reference Frame App 20090110260 - Postolov; Yuri ; et al. | 2009-04-30 |
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