Reddy; Vijay Kumar

Patent Applications and Registrations

Patent applications and USPTO patent grants for Reddy; Vijay Kumar.The latest application filed is for "devices under test".

Company Profile

0.12.11

Reddy; Vijay Kumar - Plano TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Devices under test Grant 9,778,313 - Chen , et al. October 3, 2	2017-10-03
Circuit aging sensor Grant 9,714,966 - Chen , et al. July 25, 2	2017-07-25
Devices Under Test App 20160069950 - CHEN; MIN ; et al.	2016-03-10
Methods and systems to determine a final value of random telegraph noise time constant and magnitude Grant 9,110,111 - Kapila , et al. August 18, 2	2015-08-18
Variability and aging sensor for integrated circuits Grant 9,035,706 - Chen , et al. May 19, 2	2015-05-19
Variability And Aging Sensor For Integrated Circuits App 20140197895 - CHEN; MIN ; et al.	2014-07-17
Circuit Aging Sensor App 20140097856 - Chen; Min ; et al.	2014-04-10
Parameter drift prediction Grant 8,239,814 - Reddy August 7, 2	2012-08-07
Segmented power amplifier with varying segment activation Grant 8,138,829 - Reddy , et al. March 20, 2	2012-03-20
Segmented Power Amplifier with Varying Segment Activation App 20110291754 - Reddy; Vijay Kumar ; et al.	2011-12-01
Methodology for assessing degradation due to radio frequency excitation of transistors Grant 7,974,595 - Reddy , et al. July 5, 2	2011-07-05
Tunable stress technique for reliability degradation measurement Grant 7,952,378 - Marshall , et al. May 31, 2	2011-05-31
Parameter Drift Prediction App 20100242001 - Reddy; Vijay Kumar	2010-09-23
Tunable Stress Technique For Reliability Degradation Measurement App 20100164531 - Marshall; Andrew ; et al.	2010-07-01
Methodology For Assessing Degradation Due To Radio Frequency Excitation Of Transistors App 20090167429 - Reddy; Vijay Kumar ; et al.	2009-07-02
Methods and systems for determining efficacy of stress protection circuitry Grant 7,385,383 - Reddy , et al. June 10, 2	2008-06-10
PMOS electrostatic discharge (ESD) protection device Grant 7,196,887 - Boselli , et al. March 27, 2	2007-03-27
Versatile system for accelerated stress characterization of semiconductor device structures Grant 7,026,838 - Reddy , et al. April 11, 2	2006-04-11
Versatile system for accelerated stress characterization of semiconductor device structures App 20050280477 - Reddy, Vijay Kumar ; et al.	2005-12-22
Voltage waveform generation circuit App 20050218903 - Reddy, Vijay Kumar ; et al.	2005-10-06
Method and system for determining transistor degradation mechanisms Grant 6,933,731 - Reddy , et al. August 23, 2	2005-08-23
Method and system for determining transistor degradation mechanisms App 20050086038 - Reddy, Vijay Kumar ; et al.	2005-04-21
PMOS electrostatic discharge (ESD) protection device App 20040240128 - Boselli, Gianluca ; et al.	2004-12-02

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