Reddy; Vijay

Patent Applications and Registrations

Patent applications and USPTO patent grants for Reddy; Vijay.The latest application filed is for "methods and compositions for natural killer cells".

Company Profile

4.15.12

Reddy; Vijay - Orlando FL
Reddy; Vijay - San Diego CA US
Reddy; Vijay - Plano TX
Reddy; Vijay - San Mateo CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods and compositions for natural killer cells Grant 10,874,715 - Copik , et al. December 29, 2	2020-12-29
Methods And Compositions For Natural Killer Cells App 20200138908 - Copik; Alicja ; et al.	2020-05-07
Methods and compositions for natural killer cells Grant 10,463,715 - Copik , et al. No	2019-11-05
Methods And Compositions For Natural Killer Cells App 20190117736 - Copik; Alicja ; et al.	2019-04-25
Methods And Compositions For Natural Killer Cells App 20170319659 - Copik; Alicja ; et al.	2017-11-09
Methods and compositions for natural killer cells Grant 9,623,082 - Copik , et al. April 18, 2	2017-04-18
Methods and Compositions for Natural Killer Cells App 20150190471 - Copik; Alicja ; et al.	2015-07-09
Antitoxin and vaccine platform based on nodavirus VLPS Grant 8,404,247 - Young , et al. March 26, 2	2013-03-26
Novel Antitoxin and Vaccine Platform Based on Nodavirus VLPS App 20120156237 - YOUNG; JOHN ; et al.	2012-06-21
Antitoxin and vaccine platform based on nodavirus VLPs Grant 7,998,487 - Young , et al. August 16, 2	2011-08-16
Novel antitoxin and vaccine platform based on nodavirus VLPS App 20080299148 - Young; John ; et al.	2008-12-04
Apparatus and methods for ferroelectric ram fatigue testing Grant 7,263,455 - Rodriguez , et al. August 28, 2	2007-08-28
System and method for accurate negative bias temperature instability characterization Grant 7,218,132 - Krishnan , et al. May 15, 2	2007-05-15
System and method for accurate negative bias temperature instability characterization Grant 7,212,023 - Krishnan , et al. May 1, 2	2007-05-01
System and method for accurate negative bias temperature instability characterization App 20060076971 - Krishnan; Anand T. ; et al.	2006-04-13
System and method for accurate negative bias temperature instability characterization App 20060049842 - Krishnan; Anand T. ; et al.	2006-03-09
Apparatus and methods for ferroelectric ram fatigue testing App 20050231997 - Rodriguez, John Anthony ; et al.	2005-10-20
Apparatus and methods for ferroelectric ram fatigue testing Grant 6,928,376 - Rodriguez , et al. August 9, 2	2005-08-09
Method for measuring NBTI degradation effects on integrated circuits Grant 6,815,970 - Rost , et al. November 9, 2	2004-11-09
Apparatus and methods for ferroelectric ram fatigue testing App 20040068674 - Rodriguez, John Anthony ; et al.	2004-04-08
Method for improving gate oxide integrity and interface quality in a multi-gate oxidation process Grant 6,709,932 - Krishnan , et al. March 23, 2	2004-03-23
Method For Improving Gate Oxide Integrity & Interface Quality In A Multi-gate Oxidation Process App 20040043567 - Krishnan, Anand T. ; et al.	2004-03-04
Method for measuring NBTI degradation effects on integrated circuits App 20030042926 - Rost, Timothy A. ; et al.	2003-03-06
Conductive polymer composition Grant 5,582,770 - Chu , et al. December 10, 1	1996-12-10
Conductive polymer composition and device Grant 5,580,493 - Chu , et al. December 3, 1	1996-12-03
Fluoropolymer compositions Grant 5,317,061 - Chu , et al. May 31, 1	1994-05-31

Company Registrations

SEC

0001350029

Reddy Vijay

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.