Ravid; Daniel

Patent Applications and Registrations

Patent applications and USPTO patent grants for Ravid; Daniel.The latest application filed is for "method of deep learning-based examination of a semiconductor specimen and system thereof".

Company Profile

1.4.4

Ravid; Daniel - Herzeliya IL
Ravid; Daniel - Herzelia IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method of deep learning-based examination of a semiconductor specimen and system thereof Grant 11,348,001 - Karlinsky , et al. May 31, 2	2022-05-31
Method of deep learning-based examination of a semiconductor specimen and system thereof Grant 11,205,119 - Karlinsky , et al. December 21, 2	2021-12-21
Method of deep learning-based examination of a semiconductor specimen and system thereof Grant 11,010,665 - Karlinsky , et al. May 18, 2	2021-05-18
Method Of Deep Learning-based Examination Of A Semiconductor Specimen And System Thereof App 20170364798 - KARLINSKY; Leonid ; et al.	2017-12-21
Method Of Deep Learining-based Examination Of A Semiconductor Specimen And System Thereof App 20170357895 - KARLINSKY; Leonid ; et al.	2017-12-14
Registration of CAD data with SEM images Grant 9,715,724 - Schwarzband , et al. July 25, 2	2017-07-25
Method Of Deep Learining-based Examination Of A Semiconductor Specimen And System Thereof App 20170177997 - KARLINSKY; Leonid ; et al.	2017-06-22
Registration Of Cad Data With Sem Images App 20160035076 - SCHWARZBAND; Ishai ; et al.	2016-02-04

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