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Patent applications and USPTO patent grants for Raval; Jayesh C..The latest application filed is for "method of screening static random access memories for pass transistor defects".
Patent | Date |
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Method of stressing static random access memories for pass transistor defects Grant 8,693,271 - Raval , et al. April 8, 2 | 2014-04-08 |
Method of screening static random access memories for pass transistor defects Grant 8,526,253 - Pious , et al. September 3, 2 | 2013-09-03 |
Method of Screening Static Random Access Memories for Pass Transistor Defects App 20130051169 - Pious; Beena ;   et al. | 2013-02-28 |
Method of Stressing Static Random Access Memories for Pass Transistor Defects App 20130039139 - Raval; Jayesh C. ;   et al. | 2013-02-14 |
Method to identify or screen VMIN drift on memory cells during burn-in or operation Grant 7,450,452 - Rosal , et al. November 11, 2 | 2008-11-11 |
Method to Identify or Screen VMIN Drift on Memory Cells During Burn-In or Operation App 20070297254 - Rosal; Juan A. ;   et al. | 2007-12-27 |
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