Raskin; Jean-Pierre

Patent Applications and Registrations

Patent applications and USPTO patent grants for Raskin; Jean-Pierre.The latest application filed is for "structures for radiofrequency applications and related methods".

Company Profile

4.6.10

Raskin; Jean-Pierre - Louvain-la-Neuve BE
Raskin; Jean-Pierre - Belgique FR
Raskin; Jean-Pierre - Louvain-La-Neurve Belgique
Raskin; Jean-Pierre - Saint Germain Belgique

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Structures For Radiofrequency Applications And Related Methods App 20220277988 - Desbonnets; Eric ; et al.	2022-09-01
Structures for radiofrequency applications and related methods Grant 11,367,650 - Desbonnets , et al. June 21, 2	2022-06-21
Integrated circuit device and method of manufacturing thereof Grant 11,222,944 - Raskin , et al. January 11, 2	2022-01-11
Structures For Radiofrequency Applications And Related Methods App 20210143053 - Desbonnets; Eric ; et al.	2021-05-13
Integrated Circuit Device And Method Of Manufacturing Thereof App 20210118977 - RASKIN; Jean-Pierre ; et al.	2021-04-22
Structure for radiofrequency applications Grant 10,943,815 - Desbonnets , et al. March 9, 2	2021-03-09
Method Of Electrochemically Processing A Substrate And Integrated Circuit Device App 20200411324 - SCHEEN; Gilles ; et al.	2020-12-31
Method for minimizing distortion of a signal in a radiofrequency circuit Grant 10,819,282 - Broekaart , et al. October 27, 2	2020-10-27
Method For Minimizing Distortion Of A Signal In A Radiofrequency Circuit App 20200169222 - Broekaart; Marcel ; et al.	2020-05-28
Method, device and system for measuring an electrical characteristic of a substrate Grant 10,429,436 - Malaquin , et al. October 1, 2	2019-10-01
Structure For Radiofrequency Applications App 20190157137 - Desbonnets; Eric ; et al.	2019-05-23
Method, Device And System For Measuring An Electrical Characteristic Of A Substrate App 20180024186 - Malaquin; Cedric ; et al.	2018-01-25
Internal Stress Actuated Micro- and Nanomachines for Testing Physical Properties Of Micro and Nano-Sized Material Samples. App 20100224006 - Pardoen; Thomas ; et al.	2010-09-09
Imposing And Determining Stress In Sub-micron Samples App 20100057381 - Pardoen; Thomas ; et al.	2010-03-04
Process for manufacturing a multilayer structure made from semiconducting materials Grant 7,585,748 - Raskin , et al. September 8, 2	2009-09-08
Process for manufacturing a multilayer structure made from semiconducting materials App 20060166451 - Raskin; Jean-Pierre ; et al.	2006-07-27

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