| Patent | Date |
|---|
Scan Chain Wirelength Optimization Using Q-learning Based Reinforcement Learning
App 20220100936 - ABDUL; NAIJU KARIM ; et al. | 2022-03-31 |
Core pairing in multicore systems
Grant 10,831,620 - Dusanapudi , et al. November 10, 2 | 2020-11-10 |
Formal verification driven power modeling and design verification
Grant 10,354,028 - Haridass , et al. July 16, 2 | 2019-07-16 |
Cross-current power modelling using logic simulation
Grant 10,216,878 - Joseph , et al. Feb | 2019-02-26 |
On The Fly Netlist Compression In Power Analysis
App 20180232469 - Joseph; Arun ; et al. | 2018-08-16 |
Fly Netlist Compression In Power Analysis
App 20180232470 - Joseph; Arun ; et al. | 2018-08-16 |
Cross-current power modelling using logic simulation
Grant 10,007,747 - Joseph , et al. June 26, 2 | 2018-06-26 |
On the fly netlist compression in power analysis
Grant 10,002,220 - Joseph , et al. June 19, 2 | 2018-06-19 |
On the fly netlist compression in power analysis
Grant 9,996,649 - Joseph , et al. June 12, 2 | 2018-06-12 |
Delayed equivalence identification
Grant 9,934,873 - Gajavelly , et al. April 3, 2 | 2018-04-03 |
Cross-current power modelling using logic simulation
Grant 9,916,406 - Joseph , et al. March 13, 2 | 2018-03-13 |
Core Pairing In Multicore Systems
App 20170364421 - Dusanapudi; Manoj ; et al. | 2017-12-21 |
Delayed Equivalence Identification
App 20170365362 - Gajavelly; Raj Kumar ; et al. | 2017-12-21 |
Formal Verification Driven Power Modeling And Design Verification
App 20170344678 - Haridass; Anand ; et al. | 2017-11-30 |
Cross-current Power Modelling Using Logic Simulation
App 20170337312 - Joseph; Arun ; et al. | 2017-11-23 |
Cross-current Power Modelling Using Logic Simulation
App 20170337311 - Joseph; Arun ; et al. | 2017-11-23 |
On The Fly Netlist Compression In Power Analysis
App 20170316119 - Joseph; Arun ; et al. | 2017-11-02 |
On The Fly Netlist Compression In Power Analysis
App 20170315605 - Joseph; Arun ; et al. | 2017-11-02 |
Cross-current power modelling using logic simulation
Grant 9,754,058 - Joseph , et al. September 5, 2 | 2017-09-05 |
Formal Verification Driven Power Modeling And Design Verification
App 20170235856 - Haridass; Anand ; et al. | 2017-08-17 |
Formal verification driven power modeling and design verification
Grant 9,697,306 - Haridass , et al. July 4, 2 | 2017-07-04 |
Cross-current Power Modelling Using Logic Simulation
App 20170132342 - Joseph; Arun ; et al. | 2017-05-11 |
Cross-current Power Modelling Using Logic Simulation
App 20170132343 - Joseph; Arun ; et al. | 2017-05-11 |
Addressing Early Mode Slack Fails By Book Decomposition
App 20160364518 - Madiraju; Mithula ; et al. | 2016-12-15 |
Addressing early mode slack fails by book decomposition
Grant 9,519,746 - Madiraju , et al. December 13, 2 | 2016-12-13 |
Formal verification driven power modeling and design verification
Grant 9,460,251 - Haridass , et al. October 4, 2 | 2016-10-04 |
Modified standard cells to address fast paths
Grant 9,280,630 - Lewis , et al. March 8, 2 | 2016-03-08 |
Usage-based temporal degradation estimation for memory elements
Grant 9,064,071 - Bansal , et al. June 23, 2 | 2015-06-23 |
Usage-based temporal degradation estimation for memory elements
Grant 9,058,448 - Bansal , et al. June 16, 2 | 2015-06-16 |
Estimating Delay Deterioration Due To Device Degradation In Integrated Circuits
App 20150154331 - Bansal; Aditya ; et al. | 2015-06-04 |
Estimating delay deterioration due to device degradation in integrated circuits
Grant 8,966,420 - Bansal , et al. February 24, 2 | 2015-02-24 |
Dual-cell Mtj Structure With Individual Access And Logical Combination Ability
App 20130258750 - KIM; JAE-JOON ; et al. | 2013-10-03 |
Estimating Delay Deterioration Due To Device Degradation In Integrated Circuits
App 20130254731 - Bansal; Aditya ; et al. | 2013-09-26 |
Estimating Delay Deterioration Due To Device Degradation In Integrated Circuits
App 20130253868 - BANSAL; ADITYA ; et al. | 2013-09-26 |
Enhanced static random access memory stability using asymmetric access transistors and design structure for same
Grant 8,526,219 - Bansal , et al. September 3, 2 | 2013-09-03 |
Performing logic functions on more than one memory cell within an array of memory cells
Grant 8,493,774 - Kuang , et al. July 23, 2 | 2013-07-23 |
Monitoring negative bias temperature instability (NBTI) and/or positive bias temperature instability (PBTI)
Grant 8,456,247 - Kim , et al. June 4, 2 | 2013-06-04 |
Usage-based Temporal Degradation Estimation For Memory Elements
App 20130138407 - Bansal; Aditya ; et al. | 2013-05-30 |
Usage-based Temporal Degradation Estimation For Memory Elements
App 20130138403 - Bansal; Aditya ; et al. | 2013-05-30 |
On-Chip Delay Measurement Through a Transistor Array
App 20130049791 - Jenkins; Keith A. ; et al. | 2013-02-28 |
Performing Logic Functions on More Than One Memory Cell Within an Array of Memory Cells
App 20120320689 - Kuang; Jente B. ; et al. | 2012-12-20 |
Monitoring Negative Bias Temperature Instability (nbti) And/or Positive Bias Temperature Instability (pbti)
App 20120182079 - Kim; Jae-Joon ; et al. | 2012-07-19 |
Enhanced Static Random Access Memory Stability Using Asymmetric Access Transistors and Design Structure for Same
App 20120185817 - Bansal; Aditya ; et al. | 2012-07-19 |
On-Chip Delay Measurement Through a Transistor Array
App 20120081141 - Jenkins; Keith A. ; et al. | 2012-04-05 |
Enhanced static random access memory stability using asymmetric access transistors and design structure for same
Grant 8,139,400 - Bansal , et al. March 20, 2 | 2012-03-20 |
Electronic circuit for measurement of transistor variability and the like
Grant 8,004,305 - Jenkins , et al. August 23, 2 | 2011-08-23 |
Static pulsed bus circuit and method having dynamic power supply rail selection
Grant 7,882,370 - Deogun , et al. February 1, 2 | 2011-02-01 |
Methods of operating an electronic circuit for measurement of transistor variability and the like
Grant 7,764,080 - Jenkins , et al. July 27, 2 | 2010-07-27 |
Memory circuit with decoupled read and write bit lines and improved write stability
Grant 7,746,709 - Joshi , et al. June 29, 2 | 2010-06-29 |
Circuits and design structures for monitoring NBTI (negative bias temperature instability) effect and/or PBTI (positive bias temperature instability) effect
Grant 7,642,864 - Chuang , et al. January 5, 2 | 2010-01-05 |
Electronic Circuit For Measurement Of Transistor Variability And The Like
App 20090309625 - Jenkins; Keith A. ; et al. | 2009-12-17 |
Circuits And Design Structures For Monitoring Nbti (negative Bias Temperature Instability) Effect And/or Pbti (positive Bias Temperature Instability) Effect
App 20090189703 - Chuang; Ching-Te K. ; et al. | 2009-07-30 |
Enhanced Static Random Access Memory Stability Using Asymmetric Access Transistors And Design Structure For Same
App 20090185409 - Bansal; Aditya ; et al. | 2009-07-23 |
Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocks
Grant 7,550,987 - Acharyya , et al. June 23, 2 | 2009-06-23 |
Apparatus and method for determining the slew rate of a signal produced by an integrated circuit
Grant 7,548,822 - Chuang , et al. June 16, 2 | 2009-06-16 |
Memory Circuit with Decoupled Read and Write Bit Lines and Improved Write Stability
App 20090147592 - Joshi; Rajiv V. ; et al. | 2009-06-11 |
Techniques for improving write stability of memory with decoupled read and write bit lines
Grant 7,495,969 - Joshi , et al. February 24, 2 | 2009-02-24 |
Apparatus And Method For Determining The Slew Rate Of A Signal Produced By An Integrated Circuit
App 20090018787 - Chuang; Ching-Te K. ; et al. | 2009-01-15 |
Methods of Operating an Electronic Circuit for Measurement of Transistor Variability and the Like
App 20080315907 - Jenkins; Keith A. ; et al. | 2008-12-25 |
Electronic circuit for measurement of transistor variability and the like
Grant 7,439,755 - Jenkins , et al. October 21, 2 | 2008-10-21 |
Method and Circuit for Measuring Operating and Leakage Current of Individual Blocks Within an Array of Test Circuit Blocks
App 20080209285 - Acharyya; Dhruva J. ; et al. | 2008-08-28 |
Techniques For Improving Write Stability Of Memory With Decoupled Read And Write Bit Lines
App 20080181029 - Joshi; Rajiv V. ; et al. | 2008-07-31 |
Electronic Circuit for Measurement of Transistor Variability and the Like
App 20080180134 - Jenkins; Keith A. ; et al. | 2008-07-31 |
FINFET drive strength de-quantization using multiple orientation fins
App 20080121948 - Kim; Jae-Joon ; et al. | 2008-05-29 |
Static Pulsed Bus Circuit and Method Having Dynamic Power Supply Rail Selection
App 20080069558 - Deogun; Harmander Singh ; et al. | 2008-03-20 |
Multi-threshold complementary metal-oxide semiconductor (MTCMOS) bus circuit and method for reducing bus power consumption via pulsed standby switching
Grant 7,088,141 - Deogun , et al. August 8, 2 | 2006-08-08 |
Multi-threshold complementary metal-oxide semiconductor (MTCMOS) bus circuit and method for reducing bus power consumption via pulsed standby switching
App 20060082384 - Deogun; Harmander Singh ; et al. | 2006-04-20 |
Technique for mitigating gate leakage during a sleep state
Grant 6,791,361 - Alon , et al. September 14, 2 | 2004-09-14 |
Technique for mitigating gate leakage during a sleep state
App 20040113657 - Alon, Elad ; et al. | 2004-06-17 |
| 