Rana; Narender

Patent Applications and Registrations

Patent applications and USPTO patent grants for Rana; Narender.The latest application filed is for "in-situ active wafer charge screening by conformal grounding".

Company Profile

0.5.8

Rana; Narender - Highland NY
Rana; Narender - Albany NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for estimating spatial characteristics of integrated circuits Grant 9,262,819 - Kagalwala , et al. February 16, 2	2016-02-16
In-situ Active Wafer Charge Screening By Conformal Grounding App 20140073114 - Cen; Cheng ; et al.	2014-03-13
In-situ Active Wafer Charge Screening By Conformal Grounding App 20130200501 - Cen; Cheng ; et al.	2013-08-08
Hybrid Metrology For Semiconductor Devices App 20130203188 - Vaid; Alok ; et al.	2013-08-08
Liner protection in deep trench etching Grant 8,030,157 - Hichri , et al. October 4, 2	2011-10-04
In-situ high-resolution light-optical channel for optical viewing and surface processing in parallel with charged particle (FIB and SEM) techniques Grant 7,781,733 - Herschbein , et al. August 24, 2	2010-08-24
In-situ High-resolution Light-optical Channel For Optical Viewing And Surface Processing In Parallel With Charged Particle (fib And Sem) Techniques App 20080283777 - Herschbein; Steven B. ; et al.	2008-11-20
High-resolution optical channel for non-destructive navigation and processing of integrated circuits Grant 7,351,966 - Marchman , et al. April 1, 2	2008-04-01
High-resolution Optical Channel For Non-destructive Navigation And Processing Of Integrated Circuits App 20080067369 - Marchman; Herschel M. ; et al.	2008-03-20
Ion detector for ion beam applications Grant 7,119,333 - Herschbein , et al. October 10, 2	2006-10-10
Improved Ion Detector For Ionbeam Applications App 20060097159 - Herschbein; Steven B. ; et al.	2006-05-11

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